Abstract: The invention relates to a method for THz measuring a measurement object (3), including at least the following steps: phase or a pre-measurement, in which e.g.

Abstract: The present disclosure relates to a measuring system for measuring a measured object, in particular a plastic profile, said measuring system comprising: an antenna arrangement of THz transceivers each at times actively emitting a THz transmission beam and passively receiving reflected THz radiation, where said antenna arrangement outputs measuring signals of the measurements of the THz transceivers, an adjustment means for adjusting the antenna arrangement into several measuring positions along an adjustment direction, a control and evaluation device for receiving and evaluating the measuring signals which is configured such that the measuring signals are evaluated by means of a synthetic aperture radar evaluation process and a virtual model of the boundary surfaces of the measured object is created, and subsequently the control and evaluation device determines layer thicknesses between the boundary surfaces from the virtual model.

Abstract: The invention relates to a preferably portable THz measuring apparatus (1) for determining impurities (3) in a, in particular, stationary measured object (2), the THz measuring apparatus (1) comprising: an antenna array (4) including at least one active THz transmitter, e.g. transceiver (12), emitting a THz transmission beam (15) along an optical axis (A), and a plurality of THz receivers (14), arranged under a fixed spatial arrangement in relation to the THz transmitter (12) and synchronised with the THz receiver, detect reflected THz radiation (16) and putting out THz measuring signals (S1), a controller device (5), receiving the THz measuring signals (S1) and determining impurities (3) as reflections having occurred outside ordinary boundary surfaces (2a, 2b) of the measured object (2). Hereby, the THz-Receiver (14) may also transmit temporarily, in particular alternatingly.

Abstract: The invention relates to a THz measuring device (2) for measuring a test object (8), in particular a pipe (8), including a first THz transceiver (3) which outputs a first THz beam (10) with a first polarization plane along an optical axis (A) through a measuring chamber (7), a first polarization mirror (4) designed to reflect the first THz beam (10) passing through the measuring chamber (7) back to the first THz transceiver (3) along the optical axis (A), a second THz transceiver (5), designed to output a second THz beam (11) which is polarized in a second polarization plane that is different, in particular orthogonal, from the first polarization plane, a second polarization mirror (6), designed to reflect the second THz beam (11) passing through the measuring chamber (7) along the optical axis (A) through the measuring chamber (7) back to the second Transceiver (5), wherein the THz beams pass through the respective other polarization mirrors without being substantially influenced, and the measuring signal

Abstract: The invention relates to a THz measuring method for measuring a measured object (18), including the steps: calibration measurement with emitting a THz transmission beam (5) through an empty measuring space (6) towards a main reflector (3) along an optical axis (A) and reflection of the THz transmission beams (5) at the main reflector back to the THz-Transceiver (5), which receives a signal amplitude, where a main reflection peak (P0) at a calibration time (tP0) is determined, introducing a measured object (18) into the measuring space (6), object measurement with emitting the THz transmission beams (5) from the THz transceiver along the optical axis (A) through the measuring space and the measured object, where partial reflected beams reflected back from the boundary surfaces along the optical axis are detected at partial reflection times (t1, t2, t3, t4), and a main reflection peak (P1) generated at a main reflection time (tP1) at the main reflector (3) is detected, where, in the case that for at least on

Abstract: The present disclosure relates to a THz measuring device for measuring a measuring object and a THz measuring method for measuring a measuring object.

Abstract: The present disclosure relates to a pneumatic suction conveying apparatus for conveying granulated bulk materials and a corresponding method, comprising a pump unit with a vacuum pump and a suction volume, at least two suction lines, which is connected to the suction volume and extends towards storage containers for receiving bulk materials, the suction lines each comprising a conveying hopper for separating the bulk material and a stop valve for blocking the suction line. Hereby, in the suction line there is each provided a closed control loop comprising an adjustable throttle valve and a flow sensor provided in the suction line, the control loop being adapted and designed to adjust the throttle valve depending on a measurement of the flow sensor.

Abstract: The invention relates to a preferably portable THz measuring apparatus (1) for determining impurities (3) in a, in particular, stationary measured object (2), the THz measuring apparatus (1) comprising: an antenna array (4) including at least one active THz transmitter, e.g. transceiver (12), emitting a THz transmission beam (15) along an optical axis (A), and a plurality of THz receivers (14), arranged under a fixed spatial arrangement in relation to the THz transmitter (12) and synchronised with the THz receiver, detect reflected THz radiation (16) and putting out THz measuring signals (S1), a controller device (5), receiving the THz measuring signals (S1) and determining impurities (3) as reflections having occurred outside ordinary boundary surfaces (2a, 2b) of the measured object (2). Hereby, the THz-Receiver (14) may also transmit temporarily, in particular alternatingly.

Abstract: The invention relates to a measuring system (2) for measuring a measured object, in particular a plastic profile (3), said measuring system (2) comprising: an antenna arrangement (4) made of a plurality of THz transceivers (5) each at times actively emitting a THz transmission beam (6) and at times passively receive reflected THz radiation (11), where said antenna arrangement (4) puts out measuring signals (S1) of the measurements of the THz transceivers (5), an adjustment means (12) for adjusting the antenna matrix (4) into several measuring positions (MP1, MP2, MP3) along an adjustment direction (m1, m2), e.g. on a circular path around the measured object (3), a controller and evaluation device (14) for receiving and evaluating the measuring signals (S1) which is configured in such a way that the measuring signals (S1) of said several THz transceivers (5) in said several measuring positions (MP1, MP2, . . .

Abstract: The invention relates to a method for THz measuring a measurement object (3), including at least the following steps: phase or a pre-measurement, in which e.g.

Abstract: The invention relates to a terahertz measuring apparatus (1) for measuring a test object (2) by means of a run-time measurement while determining at least one distance (d1, d2, d3, d4), said terahertz measuring apparatus (1) comprising: a terahertz transmitter and receiver unit (3) for emitting terahertz radiation (5) and detecting the terahertz radiation reflected by the test object (2), and an evaluation unit (12) for determining a run-time of the terahertz radiation and at least one distance of the test object (2), Hereby, it is provided, that at least one, preferably several passive terahertz receiver devices (4) are provided the optical axes (C-4) of which are arranged shifted or angled in relation to the optical axis (C-3) of the terahertz transmitter and receiver unit (3) and detect a second reflected terahertz radiation (6b) emitted by the terahertz transmitter and receiver unit (3) and reflected on the test object (2), a data connection (10) for synchronising the terahertz transmitter and receive

Abstract: The invention relates to a THz measuring device (1) for determining at least one layer thickness (a1, a2, a3, a4) of a test object (20, 120, 220), the measuring device Messgerät (1) comprising: a THz transmitter and receiver unit (14) for emitting THz radiation (15) along an optical axis (A) and for receiving reflected THz radiation (16) along the optical axis (A), a controller unit (10) for driving the transmitter and receiver unit (14) Hereby, the THz measuring device (1) is preferably portable including a grip region (34) for grabbing and positioning by the operator, whereby it comprises, at a front end are (5), in particular, a moulded screen (5), a support contour (7) including several support points (P, P1, P2, P3, P4) for being applied to a curved surface (18) of the test object (20, 120, 220), for perpendicular positioning on the surface (18, 118, 218).

Abstract: The invention relates to a method and a terahertz measuring apparatus for measuring a layer thickness and/or a distance, wherein at least one terahertz beam (7a) is radiated from a terahertz transmission and reception unit (4) along an optical axis (C) onto the measurement object (2, 102) and terahertz radiation (7) that has passed through at least one layer (3) of the measurement object (2, 102) and having been reflected is detected wherein a measurement signal (A) of the detected reflected terahertz radiation (7b) is evaluated and a layer thickness (d) is ascertained from a propagation time difference (t2?t1) of the radiation (7) reflected at boundary layers (2a, 2b) of the layer (3).

Abstract: The invention relates to a terahertz measuring apparatus (1) for measuring a test object (2) by means of a run-time measurement while determining at least one distance (d1, d2, d3, d4), said terahertz measuring apparatus (1) comprising: a terahertz transmitter and receiver unit (3) for emitting terahertz radiation (5) and detecting the terahertz radiation reflected by the test object (2), and an evaluation unit (12) for determining a run-time of the terahertz radiation and at least one distance of the test object (2), Hereby, it is provided, that at least one, preferably several passive terahertz receiver devices (4) are provided the optical axes (C-4) of which are arranged shifted or angled in relation to the optical axis (C-3) of the terahertz transmitter and receiver unit (3) and detect a second reflected terahertz radiation (6b) emitted by the terahertz transmitter and receiver unit (3) and reflected on the test object (2), a data connection (10) for synchronising the terahertz transmitter and receive

Abstract: The invention relates to a THz measuring device (1) for determining at least one layer thickness (a1, a2, a3, a4) of a test object (20, 120, 220), the measuring device Messgerät (1) comprising: a THz transmitter and receiver unit (14) for emitting THz radiation (15) along an optical axis (A) and for receiving reflected THz radiation (16) along the optical axis (A), a controller unit (10) for driving the transmitter and receiver unit (14) Hereby, the THz measuring device (1) is preferably portable including a grip region (34) for grabbing and positioning by the operator, whereby it comprises, at a front end are (5), in particular, a moulded screen (5), a support contour (7) including several support points (P, P1, P2, P3, P4) for being applied to a curved surface (18) of the test object (20, 120, 220), for perpendicular positioning on the surface (18, 118, 218).

Abstract: The invention relates to a method and a terahertz measuring apparatus for measuring a layer thickness and/or a distance, wherein at least one terahertz beam (7a) is radiated from a terahertz transmission and reception unit (4) along an optical axis (C) onto the measurement object (2, 102) and terahertz radiation (7) that has passed through at least one layer (3) of the measurement object (2, 102) and having been reflected is detected wherein a measurement signal (A) of the detected reflected terahertz radiation (7b) is evaluated and a layer thickness (d) is ascertained from a propagation time difference (t2?t1) of the radiation (7) reflected at boundary layers (2a, 2b) of the layer (3).