Patents by Inventor Ramakanth Ramini

Ramakanth Ramini has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10436720
    Abstract: Methods and systems for classifying defects detected on a specimen with an adaptive automatic defect classifier are provided. One method includes creating a defect classifier based on classifications received from a user for different groups of defects in first lot results and a training set of defects that includes all the defects in the first lot results. The first and additional lot results are combined to create cumulative lot results. Defects in the cumulative lot results are classified with the created defect classifier. If any of the defects are classified with a confidence below a threshold, the defect classifier is modified based on a modified training set that includes the low confidence classified defects and classifications for these defects received from a user. The modified defect classifier is then used to classify defects in additional cumulative lot results.
    Type: Grant
    Filed: January 8, 2016
    Date of Patent: October 8, 2019
    Assignee: KLA-Tenfor Corp.
    Inventors: Li He, Martin Plihal, Huajun Ying, Anadi Bhatia, Amitoz Singh Dandiana, Ramakanth Ramini
  • Publication number: 20170082555
    Abstract: Methods and systems for classifying defects detected on a specimen with an adaptive automatic defect classifier are provided. One method includes creating a defect classifier based on classifications received from a user for different groups of defects in first lot results and a training set of defects that includes all the defects in the first lot results. The first and additional lot results are combined to create cumulative lot results. Defects in the cumulative lot results are classified with the created defect classifier. If any of the defects are classified with a confidence below a threshold, the defect classifier is modified based on a modified training set that includes the low confidence classified defects and classifications for these defects received from a user. The modified defect classifier is then used to classify defects in additional cumulative lot results.
    Type: Application
    Filed: January 8, 2016
    Publication date: March 23, 2017
    Inventors: Li He, Martin Plihal, Huajun Ying, Anadi Bhatia, Amitoz Singh Dandiana, Ramakanth Ramini