Patents by Inventor Ramakrishna C. Dhanekula
Ramakrishna C. Dhanekula has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7912685Abstract: A system that mitigates quantization effects in quantized telemetry signals. During operation, the system monitors a set of quantized telemetry signals. For a given quantized telemetry signal in the set of quantized telemetry signals, the system uses a set of models to generate a set of estimates for the given quantized telemetry signal from the other monitored quantized telemetry signals, wherein each model in the set of models was initialized using a different randomly selected subset of a training dataset. The system then averages the set of estimates to produce an estimated signal for the given quantized telemetry signal.Type: GrantFiled: January 22, 2007Date of Patent: March 22, 2011Assignee: Oracle America, Inc.Inventors: Ramakrishna C. Dhanekula, Kenny C. Gross, Keith A. Whisnant
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Patent number: 7869977Abstract: Some embodiments of the present invention provide a system that characterizes a computer system parameter by analyzing a target electromagnetic signal radiating from the computer system. First, the target electromagnetic signal is monitored using a first antenna and a second antenna, wherein an axis of the second antenna is oriented non-parallel to an axis of the first antenna. Then, the target electromagnetic signal received from the first antenna and the target electromagnetic signal received from the second antenna are separately analyzed to characterize the computer system parameter.Type: GrantFiled: August 8, 2008Date of Patent: January 11, 2011Assignee: Oracle America, Inc.Inventors: Andrew J Lewis, Ramakrishna C. Dhanekula, Kenny C. Gross
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Patent number: 7869965Abstract: A system that facilitates estimating power consumption in a computer system by inferring the power consumption from instrumentation signals. During operation, the system monitors instrumentation signals within the computer system, wherein the instrumentation signals do not include corresponding current and voltage signals that can be used to directly compute power consumption. The system then estimates the power consumption for the computer system by inferring the power consumption from the instrumentation signals and from an inferential power model generated during a training phase.Type: GrantFiled: August 17, 2005Date of Patent: January 11, 2011Assignee: Oracle America, Inc.Inventors: Kenny C. Gross, Kalyanaraman Vaidyanathan, Ramakrishna C. Dhanekula
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Publication number: 20100332199Abstract: One embodiment provides a system that analyzes a target electromagnetic signal radiating from a monitored system. During operation, the system monitors the target electromagnetic signal using a set of antennas to obtain a set of received target electromagnetic signals from the monitored system. Next, the system calculates a weighted mean of the received target electromagnetic signals using a first pattern-recognition model. The system then subtracts the received target electromagnetic signals from the weighted mean of the received target electromagnetic signals to obtain a set of noise-reduced signals for the monitored system. Finally, the system assesses the integrity of the monitored system by analyzing the noise-reduced signals using a second pattern-recognition model.Type: ApplicationFiled: June 30, 2009Publication date: December 30, 2010Applicant: SUN MICROSYSTEMS, INC.Inventors: Ramakrishna C. Dhanekula, Kenny C. Gross, Andrew J. Lewis
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Publication number: 20100306165Abstract: One embodiment provides a technique for analyzing a target electromagnetic signal radiating from a monitored system. During the technique, the monitored system is positioned at a first locus of an ellipsoidal surface to amplify the target electromagnetic signal received at a second locus of the ellipsoidal surface. Next, the amplified target electromagnetic signal is monitored using an antenna positioned at the second locus of the ellipsoidal surface. Finally, the integrity of the monitored system is assessed by analyzing the amplified target electromagnetic signal monitored by the antenna.Type: ApplicationFiled: May 27, 2009Publication date: December 2, 2010Applicant: SUN MICROSYSTEMS, INC.Inventors: Kenny C. Gross, Ramakrishna C. Dhanekula, David K. McElfresh
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Publication number: 20100305892Abstract: One embodiment provides a system that analyzes a target electromagnetic signal radiating from a monitored system. During operation, the system monitors the target electromagnetic signal using a near-isotropic antenna that includes a set of receiving surfaces arranged in a regular polyhedron. Next, the system obtains a set of received target electromagnetic signals from the receiving surfaces. Finally, the system assesses the integrity of the monitored system by separately analyzing each of the received target electromagnetic signals.Type: ApplicationFiled: May 29, 2009Publication date: December 2, 2010Applicant: SUN MICROSYSTEMS, INC.Inventors: Kenny C. Gross, Robert P. Masleid, Ramakrishna C. Dhanekula, David K. McElfresh
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Patent number: 7840391Abstract: A computer system to predict a value of a signal from a sensor schedule loads across a set of processor cores is described. During operation, the computer system generates N models to predict the value of the signal based on a set of quantized telemetry signals, where a given model produces a value of the signal using a subset of the set of quantized telemetry signals, and where the subset is selected from the set of quantized telemetry signals based on an objective criterion. Next, the computer system predicts the value of the signal by aggregating the values produced by the N models.Type: GrantFiled: October 12, 2007Date of Patent: November 23, 2010Assignee: Oracle America, Inc.Inventors: Ramakrishna C. Dhanekula, Keith A. Whisnant, Kenny C. Gross
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Publication number: 20100292959Abstract: One embodiment provides a system that analyzes telemetry data from a monitored system. During operation, the system periodically obtains the telemetry data as a set of telemetry variables from the monitored system and updates a multidimensional real-time distribution of the telemetry data using the obtained telemetry variables. Next, the system analyzes a statistical deviation of the multidimensional real-time distribution from a multidimensional reference distribution for the monitored system using a multivariate sequential probability ratio test (SPRT) and assesses the integrity of the monitored system based on the statistical deviation of the multidimensional real-time distribution. If the assessed integrity falls below a threshold, the system determines a fault in the monitored system corresponding to a source of the statistical deviation.Type: ApplicationFiled: May 14, 2009Publication date: November 18, 2010Applicant: SUN MICROSYSTEMS, INC.Inventors: Kenny C. Gross, Ramakrishna C. Dhanekula, Aleksey M. Urmanov
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Publication number: 20100161525Abstract: One embodiment of the present invention provides a system that characterizes a computer system parameter by analyzing a target electromagnetic signal radiating from the computer system. First, the system monitors the target electromagnetic signal using a first directional antenna located outside of the computer system, wherein the first directional antenna is directed at a location inside the computer system. The system also monitors the target electromagnetic signal using a second directional antenna located outside of the computer system, wherein a receiving axis of the second antenna is oriented non-parallel to a receiving axis of the first antenna, and wherein the second directional antenna is directed at the location inside the computer system. Next, the system characterizes the computer system parameter based on the target electromagnetic signal received from the first antenna and the target electromagnetic signal received from the second antenna.Type: ApplicationFiled: December 19, 2008Publication date: June 24, 2010Applicant: SUN MICROSYSTEMS, INC.Inventors: Kenny C. Gross, Ramakrishna C. Dhanekula, Andrew J. Lewis, Aleksey M. Urmanov
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Publication number: 20100145891Abstract: Some embodiments of the present invention provide a system that generates extended data for a pattern-recognition model used in electronic prognostication for a computer system. During operation the system determines, for each sensor in a set of sensors, a regression coefficient between training data from the sensor and training data from each of the other sensors in the set of sensors. Next, for each sensor in the set of sensors, the system stretches the training data from each of the other sensors by a predetermined amount, and generates extended data for the sensor based on the stretched training data for each of the other sensors and the regression coefficients between training data from the sensor and training data from each of the other sensors.Type: ApplicationFiled: December 9, 2008Publication date: June 10, 2010Applicant: SUN MICROSYSTEMS, INC.Inventors: Ramakrishna C. Dhanekula, Kenny C. Gross
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Patent number: 7725285Abstract: A system that determines whether components are not present in a computer system is presented. During operation the system receives telemetry signals from sensors within the computer system. Next, the system dynamically generates a temperature map for the computer system based on the telemetry signals. The system then analyzes the temperature map to determine whether components are not present in the computer system.Type: GrantFiled: December 26, 2007Date of Patent: May 25, 2010Assignee: Oracle America, Inc.Inventors: Ramakrishna C. Dhanekula, Kenny C. Gross, Kalyanaraman Vaidyanathan, Glenn A. Herdeg
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Patent number: 7725292Abstract: A system that select tests to exercise a given computer system is described. During operation, the system tests the given computer system using a set of tests, where a given test includes a given load and a given cycling time selected from a range of cycling times. Moreover, for the given test, the system monitors a stress metric in the given computer system. Additionally, the system selects at least one of the tests from the set of tests to exercise the given computer system based on the monitored stress metric.Type: GrantFiled: October 17, 2007Date of Patent: May 25, 2010Assignee: Oracle America, Inc.Inventors: Kenny C. Gross, Ramakrishna C. Dhanekula, Kalyanaraman Vaidyanathan
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Publication number: 20100082299Abstract: Some embodiments of the present invention provide a system that characterizes a computer system using a pattern-recognition model. First, values for an environmental parameter are monitored from a set of sensors associated with the computer system. Then, a baseline for the environmental parameter is calculated based on the monitored values from a subset of the set of sensors. Next, the baseline is subtracted from the monitored values from sensors in the set of sensors to produce compensated values. Then, the compensated values are used as inputs to the pattern-recognition model, which produces estimates for the compensated values based on correlations between the compensated values learned during a training phase. Next, residuals are calculated by subtracting the estimates for the compensated values from the compensated values. Then, the residuals are analyzed to characterize the computer system.Type: ApplicationFiled: September 29, 2008Publication date: April 1, 2010Applicant: SUN MICROSYSTEMS, INC.Inventors: Ramakrishna C. Dhanekula, Keith A. Whisnant, Kenny C. Gross
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Publication number: 20100033386Abstract: Some embodiments of the present invention provide a system that characterizes a computer system parameter by analyzing a target electromagnetic signal radiating from the computer system. First, the target electromagnetic signal is monitored using a first antenna and a second antenna, wherein an axis of the second antenna is oriented non-parallel to an axis of the first antenna. Then, the target electromagnetic signal received from the first antenna and the target electromagnetic signal received from the second antenna are separately analyzed to characterize the computer system parameter.Type: ApplicationFiled: August 8, 2008Publication date: February 11, 2010Applicant: SUN MICROSYSTEMS, INC.Inventors: Andrew J. Lewis, Ramakrishna C. Dhanekula, Kenny C. Gross
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Publication number: 20100023282Abstract: Some embodiments of the present invention provide a system that characterizes a computer system parameter by analyzing a target electromagnetic signal radiating from the computer system. First, the target electromagnetic signal is monitored using a conductor in an interface of the computer system. Then, the target electromagnetic signal is analyzed to characterize the computer system parameter.Type: ApplicationFiled: July 22, 2008Publication date: January 28, 2010Applicant: SUN MICROSYSTEM, INC.Inventors: Andrew J. Lewis, Kenny C. Gross, Aleksey M. Urmanov, Ramakrishna C. Dhanekula
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Publication number: 20090292490Abstract: One embodiment of the present invention provides a system that determines a total whisker length for conductive whiskers on a circuit in a computer system. During operation, a target electromagnetic signal radiating from the computer system is monitored. Then, the target electromagnetic signal is analyzed to determine the total whisker length for conductive whiskers on the circuit in the computer system.Type: ApplicationFiled: May 23, 2008Publication date: November 26, 2009Applicant: SUN MICROSYSTEMS, INC.Inventors: David K. McElfresh, Kenny C. Gross, Ramakrishna C. Dhanekula
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Patent number: 7613576Abstract: A system that monitors electromagnetic interference (EMI) signals to facilitate proactive fault monitoring in a computer system is presented. During operation, the system receives EMI signals from one or more antennas located in close proximity to the computer system. The system then analyzes the received signals to proactively detect anomalies during operation of the computer system.Type: GrantFiled: April 12, 2007Date of Patent: November 3, 2009Assignee: Sun Microsystems, Inc.Inventors: Kenny C. Gross, Aleksey M. Urmanov, Ramakrishna C. Dhanekula, Steven F. Zwinger
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Patent number: 7613580Abstract: A system that generates an electromagnetic interference (EMI) fingerprint for a computer system is presented. During operation, the system executes a load script on the computer system, wherein the load script includes a specified sequence of operations. Next, the system receives EMI signals generated by the computer system while executing the load script. The system then generates the EMI fingerprint from the received EMI signals.Type: GrantFiled: April 12, 2007Date of Patent: November 3, 2009Assignee: Sun Microsystems, Inc.Inventors: Kenny C. Gross, Aleksey M. Urmanov, Ramakrishna C. Dhanekula
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Publication number: 20090235062Abstract: A system that controls one or more operating parameters in a computer system is presented. Until specified values for one or more operating parameters are achieved, the system performs the following operations. The system operates the computer system using a specified load profile. The system then determines whether the specified load profile produces the specified values for the one or more operating parameters. If the specified load profile does not produce the specified values for the one or more operating parameters, the system adjusts the specified load profile, which involves using a pulse-width modulation technique to adjust a duty cycle between a first workload and a second workload.Type: ApplicationFiled: March 13, 2008Publication date: September 17, 2009Applicant: SUN MICROSYSTEMS, INC.Inventors: Kalyanaraman Vaidyanathan, Kenny C. Gross, Ramakrishna C. Dhanekula
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Publication number: 20090171612Abstract: A system that determines whether components are not present in a computer system is presented. During operation the system receives telemetry signals from sensors within the computer system. Next, the system dynamically generates a temperature map for the computer system based on the telemetry signals. The system then analyzes the temperature map to determine whether components are not present in the computer system.Type: ApplicationFiled: December 26, 2007Publication date: July 2, 2009Applicant: SUN MICROSYSTEMS, INC.Inventors: Ramakrishna C. Dhanekula, Kenny C. Gross, Kalyanaraman Vaidyanathan, Glenn A. Herdeg