Patents by Inventor Ramanujam Shinidhi Embar

Ramanujam Shinidhi Embar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Amplifier calibration
    Patent number: 8957734
    Abstract: A system and method of calibrating an amplifier are presented. The amplifier has a first amplification path and a second amplification path. A first state of the amplifier is identified defining a first phase shift of the first path and a second phase shift of the second path resulting in a maximum efficiency of the amplifier when an attenuation of the first path and an attenuation of the second path are set to first attenuation values. The attenuation of the first path and the attenuation of the second path is set to achieve a maximum efficiency of the amplifier when the phase shift of the first path and the phase shift of the second path are set according to the first state.
    Type: Grant
    Filed: August 20, 2014
    Date of Patent: February 17, 2015
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Abdulrhman M. S. Ahmed, Paul R. Hart, Ramanujam Shinidhi Embar
  • AMPLIFIER CALIBRATION
    Publication number: 20140354362
    Abstract: A system and method of calibrating an amplifier are presented. The amplifier has a first amplification path and a second amplification path. A first state of the amplifier is identified defining a first phase shift of the first path and a second phase shift of the second path resulting in a maximum efficiency of the amplifier when an attenuation of the first path and an attenuation of the second path are set to first attenuation values. The attenuation of the first path and the attenuation of the second path is set to achieve a maximum efficiency of the amplifier when the phase shift of the first path and the phase shift of the second path are set according to the first state.
    Type: Application
    Filed: August 20, 2014
    Publication date: December 4, 2014
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Abdulrhman M.S. Ahmed, Paul R. Hart, Ramanujam Shinidhi Embar
  • Amplifier calibration
    Patent number: 8816767
    Abstract: A system and method of calibrating an amplifier are presented. The amplifier has a first amplification path and a second amplification path. A first state of the amplifier is identified defining a first phase shift of the first path and a second phase shift of the second path resulting in a maximum efficiency of the amplifier when an attenuation of the first path and an attenuation of the second path are set to first attenuation values. The attenuation of the first path and the attenuation of the second path is set to achieve a maximum efficiency of the amplifier when the phase shift of the first path and the phase shift of the second path are set according to the first state.
    Type: Grant
    Filed: January 10, 2014
    Date of Patent: August 26, 2014
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Abdulrhman M. S. Ahmed, Paul R. Hart, Ramanujam Shinidhi Embar
  • AMPLIFIER CALIBRATION
    Publication number: 20140125409
    Abstract: A system and method of calibrating an amplifier are presented. The amplifier has a first amplification path and a second amplification path. A first state of the amplifier is identified defining a first phase shift of the first path and a second phase shift of the second path resulting in a maximum efficiency of the amplifier when an attenuation of the first path and an attenuation of the second path are set to first attenuation values. The attenuation of the first path and the attenuation of the second path is set to achieve a maximum efficiency of the amplifier when the phase shift of the first path and the phase shift of the second path are set according to the first state.
    Type: Application
    Filed: January 10, 2014
    Publication date: May 8, 2014
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Abdulrhman M.S. Ahmed, Paul R. Hart, Ramanujam Shinidhi Embar
  • Amplifier calibration
    Patent number: 8653890
    Abstract: A system and method of calibrating an amplifier are presented. The amplifier has a first amplification path and a second amplification path. An attenuation of the first amplification path is set to a first attenuation value and an attenuation of the second amplification path is set to the first attenuation value. A first phase shift of the first amplification path and a second phase shift of the second amplification path that meets a first performance criteria is determined. A phase shift of the first amplification path is set to the first phase shift and a phase shift of the second amplification path is set to the second phase shift. A first attenuation of the first amplification path and a second attenuation of the second amplification path that meets a second performance criteria is determined.
    Type: Grant
    Filed: October 19, 2012
    Date of Patent: February 18, 2014
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Abdulrhman M. S. Ahmed, Paul R Hart, Ramanujam Shinidhi Embar