Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The invention provides for the hierarchical verification of clock domain crossings. In various implementations of the invention, a device design is partitioned into blocks. Subsequently, a block level clock domain crossing verification process is performed on selected ones of the blocks. Verification interface files are generated by the block level clock domain crossing process. After which, a top level clock domain crossing verification process is performed over the entire design. In various implementations, the top level clock domain crossing verification process utilizes the verification interface files to verify clock domain crossing signals between blocks. Additionally, in some implementations, blocks not verified during block level verification are verified during top level verification. With some implementations of the invention, the device design is partitioned based input from a user of the implementation.

Abstract: The invention provides for the hierarchical verification of clock domain crossings. In various implementations of the invention, a device design is partitioned into blocks. Subsequently, a block level clock domain crossing verification process is performed on selected ones of the blocks. Verification interface files are generated by the block level clock domain crossing process. After which, a top level clock domain crossing verification process is performed over the entire design. In various implementations, the top level clock domain crossing verification process utilizes the verification interface files to verify clock domain crossing signals between blocks. Additionally, in some implementations, blocks not verified during block level verification are verified during top level verification. With some implementations of the invention, the device design is partitioned based input from a user of the implementation.

Abstract: The invention provides for the hierarchical verification of clock domain crossings. In various implementations of the invention, a device design is partitioned into blocks. Subsequently, a block level clock domain crossing verification process is performed on selected ones of the blocks. Verification interface files are generated by the block level clock domain crossing process. After which, a top level clock domain crossing verification process is performed over the entire design. In various implementations, the top level clock domain crossing verification process utilizes the verification interface files to verify clock domain crossing signals between blocks. Additionally, in some implementations, blocks not verified during block level verification are verified during top level verification. With some implementations of the invention, the device design is partitioned based input from a user of the implementation.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: A computer is programmed to automatically select a state or a set of states of a digital circuit that are visited during simulation, for use as one or more initial states by a formal verification tool. Such automatic selection of one or more simulation states reduces the set of all simulation states to a small subset, thereby to address the state space explosion problem. Depending on the embodiment, the programmed computer uses one or more criteria provided by a library and/or by the user, in making its selection of states. Such criteria may be based on a property (assertion/checker) of the digital circuit and/or a signal generated during simulation. Furthermore, after such criteria (also called “primary criteria”) are applied, the selected states may be pruned by application of additional criteria (also called “secondary criteria”) prior to formal analysis.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.

Abstract: The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicated that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.