Patents by Inventor Ramit Bhandari

Ramit Bhandari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of using automated test equipment to screen for leakage inducing defects after calibration to intrinsic leakage
    Patent number: 7379836
    Abstract: The present invention is directed to a method of identifying test devices having excessive leakage current and also includes computer program products that enable the same. The method obtaining background test data using a test routine to measure the leakage current for a set of test devices as a function of a parameter associated with device speed for the device under test. From the test data, a leakage threshold function is defined that correlates leakage current with the parameter associated with device speed. The test routine and the leakage threshold function are then input into an automated testing apparatus configured to execute the test on production or other devices. Devices are tested to determine leakage current over a range of parameter values associated with device speed. The devices are then screened using the leakage threshold function to determine the status of the device.
    Type: Grant
    Filed: December 14, 2005
    Date of Patent: May 27, 2008
    Assignee: LSI Corporation
    Inventors: Philippe Schoenborn, Ramit Bhandari, Tony Lo, Anh-Ha Tran
  • Method of using automated test equipment to screen for leakage inducing defects after calibration to intrinsic leakage
    Publication number: 20070136023
    Abstract: The present invention is directed to a method of identifying test devices having excessive leakage current and also includes computer program products that enable the same. The method obtaining background test data using a test routine to measure the leakage current for a set of test devices as a function of a parameter associated with device speed for the device under test. From the test data, a leakage threshold function is defined that correlates leakage current with the parameter associated with device speed. The test routine and the leakage threshold function are then input into an automated testing apparatus configured to execute the test on production or other devices. Devices are tested to determine leakage current over a range of parameter values associated with device speed. The devices are then screened using the leakage threshold function to determine the status of the device.
    Type: Application
    Filed: December 14, 2005
    Publication date: June 14, 2007
    Inventors: Philippe Schoenborn, Ramit Bhandari, Tony Lo, Anh-Ha Tran