Patents by Inventor Ramprasath A. Prakash

Ramprasath A. Prakash has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automated detection of artifacts in scan image
    Patent number: 11288809
    Abstract: A method of analyzing an atomic force microscope image includes receiving data related to an atomic force microscope image, where the data includes at least a first channel of data and a second channel of data relating to a first and second image data type. The method also includes identifying at least a first location of high contrast within the image using the first image data type using edge detection and identifying a first artifact within the image based on the identified first location of high contrast. The method also includes accessing the second image data type corresponding to the identified first location of the first artifact and determining a type of the first artifact by comparing the first image data type with the second image data type relating to the identified location of the first artifact.
    Type: Grant
    Filed: May 6, 2020
    Date of Patent: March 29, 2022
    Assignee: Seagate Technology LLC
    Inventors: Zhiyu Chen, Ramprasath A. Prakash
  • AUTOMATED DETECTION OF ARTIFACTS IN SCAN IMAGE
    Publication number: 20200265583
    Abstract: A method of analyzing an atomic force microscope image includes receiving data related to an atomic force microscope image, where the data includes at least a first channel of data and a second channel of data relating to a first and second image data type. The method also includes identifying at least a first location of high contrast within the image using the first image data type using edge detection and identifying a first artifact within the image based on the identified first location of high contrast. The method also includes accessing the second image data type corresponding to the identified first location of the first artifact and determining a type of the first artifact by comparing the first image data type with the second image data type relating to the identified location of the first artifact.
    Type: Application
    Filed: May 6, 2020
    Publication date: August 20, 2020
    Inventors: Zhiyu Chen, Ramprasath A. Prakash
  • Automated detection of artifacts in scan image
    Patent number: 10679353
    Abstract: A method of analyzing an atomic force microscope image includes receiving data related to an atomic force microscope image, where the data includes at least a first channel of data and a second channel of data relating to a first and second image data type. The method also includes identifying at least a first location of high contrast within the image using the first image data type using edge detection and identifying a first artifact within the image based on the identified first location of high contrast. The method also includes accessing the second image data type corresponding to the identified first location of the first artifact and determining a type of the first artifact by comparing the first image data type with the second image data type relating to the identified location of the first artifact.
    Type: Grant
    Filed: November 7, 2017
    Date of Patent: June 9, 2020
    Assignee: Seagate Technology LLC
    Inventors: Zhiyu Chen, Ramprasath A. Prakash
  • AUTOMATED DETECTION OF ARTIFACTS IN SCAN IMAGE
    Publication number: 20190139224
    Abstract: A method of analyzing an atomic force microscope image includes receiving data related to an atomic force microscope image, where the data includes at least a first channel of data and a second channel of data relating to a first and second image data type. The method also includes identifying at least a first location of high contrast within the image using the first image data type using edge detection and identifying a first artifact within the image based on the identified first location of high contrast. The method also includes accessing the second image data type corresponding to the identified first location of the first artifact and determining a type of the first artifact by comparing the first image data type with the second image data type relating to the identified location of the first artifact.
    Type: Application
    Filed: November 7, 2017
    Publication date: May 9, 2019
    Inventors: Zhiyu Chen, Ramprasath A. Prakash