Abstract: A circuit for sensing local operating properties of an integrated circuit is disclosed. The circuit may include one or more sensor circuits configured to sense the local operating properties of the integrated circuit. The sensor circuits may receive a supply voltage with a magnitude in a limited range from a digital power supply that is different from the digital power supply that provides power to functional circuits in the integrated circuit. Level shifters may be coupled to the sensor circuits to shift output signals from the sensor circuits to levels that correspond to the digital power supply that provides power to functional circuits in the integrated circuit. Counters and a shift register may be coupled to the level shifters to receive the shifted output signals, the values of which may be used to determine the local operating properties of the integrated circuit as sensed by the sensor circuits.

Abstract: A circuit for sensing local operating properties of an integrated circuit is disclosed. The circuit may include one or more sensor circuits configured to sense the local operating properties of the integrated circuit. The sensor circuits may receive a supply voltage with a magnitude in a limited range from a digital power supply that is different from the digital power supply that provides power to functional circuits in the integrated circuit. Level shifters may be coupled to the sensor circuits to shift output signals from the sensor circuits to levels that correspond to the digital power supply that provides power to functional circuits in the integrated circuit. Counters and a shift register may be coupled to the level shifters to receive the shifted output signals, the values of which may be used to determine the local operating properties of the integrated circuit as sensed by the sensor circuits.

Abstract: A circuit for sensing local operating properties of an integrated circuit is disclosed. The circuit may include one or more sensor circuits configured to sense the local operating properties of the integrated circuit. The sensor circuits may receive a supply voltage with a magnitude in a limited range from a digital power supply that is different from the digital power supply that provides power to functional circuits in the integrated circuit. Level shifters may be coupled to the sensor circuits to shift output signals from the sensor circuits to levels that correspond to the digital power supply that provides power to functional circuits in the integrated circuit. Counters and a shift register may be coupled to the level shifters to receive the shifted output signals, the values of which may be used to determine the local operating properties of the integrated circuit as sensed by the sensor circuits.

Abstract: A circuit for sensing local operating properties of an integrated circuit is disclosed. The circuit may include one or more sensor circuits configured to sense the local operating properties of the integrated circuit. The sensor circuits may receive a supply voltage with a magnitude in a limited range from a digital power supply that is different from the digital power supply that provides power to functional circuits in the integrated circuit. Level shifters may be coupled to the sensor circuits to shift output signals from the sensor circuits to levels that correspond to the digital power supply that provides power to functional circuits in the integrated circuit. Counters and a shift register may be coupled to the level shifters to receive the shifted output signals, the values of which may be used to determine the local operating properties of the integrated circuit as sensed by the sensor circuits.

Abstract: A circuit for sensing local operating properties of an integrated circuit is disclosed. The circuit may include one or more sensor circuits configured to sense the local operating properties of the integrated circuit. The sensor circuits may receive a supply voltage with a magnitude in a limited range from a digital power supply that is different from the digital power supply that provides power to functional circuits in the integrated circuit. Level shifters may be coupled to the sensor circuits to shift output signals from the sensor circuits to levels that correspond to the digital power supply that provides power to functional circuits in the integrated circuit. Counters and a shift register may be coupled to the level shifters to receive the shifted output signals, the values of which may be used to determine the local operating properties of the integrated circuit as sensed by the sensor circuits.

Abstract: A circuit that produces an output signal having a frequency that is proportional to absolute temperature (PTAT) is disclosed. In one embodiment, the circuit includes a ring oscillator and a bias current circuit coupled thereto. The ring oscillator and the bias current circuit are implemented in close proximity to one another. During operation, the bias current circuit generates a bias current that is provided to the ring oscillator. The amount of bias current generated is dependent upon the temperature of the circuit. In turn, the frequency of an output signal provided by the ring oscillator is dependent on the amount of bias current received from the bias current circuit. Accordingly, the frequency of the ring oscillator output signal is dependent on the temperature of the circuit.

Abstract: Actual distributed temperature sensing (DTS) data and pressure data are received in response to a stimulation treatment applied to a hydrocarbon field. A pre-stimulation model is built that includes reservoir parameters, which generates simulated DTS and pressure data as a function of the reservoir parameters that include a permeability parameter and a skin parameter. In response to determining that a thermal match between the actual DTS and pressure data and the simulated DTS and pressure data is not obtained, the reservoir parameters are updated. In response to determining that the updated reservoir parameters do not match a performed pressure transient analysis (PTA), the reservoir parameters and the pre-stimulation model are updated, and the simulated DTS and pressure data are re-generated based on the updated pre-stimulation model.

Abstract: A circuit that produces an output signal having a frequency that is proportional to absolute temperature (PTAT) is disclosed. In one embodiment, the circuit includes a ring oscillator and a bias current circuit coupled thereto. The ring oscillator and the bias current circuit are implemented in close proximity to one another. During operation, the bias current circuit generates a bias current that is provided to the ring oscillator. The amount of bias current generated is dependent upon the temperature of the circuit. In turn, the frequency of an output signal provided by the ring oscillator is dependent on the amount of bias current received from the bias current circuit. Accordingly, the frequency of the ring oscillator output signal is dependent on the temperature of the circuit.

Abstract: A sensor circuit and integrated circuit having the same is disclosed. In one embodiment, a sensor circuit includes first and second ring oscillators having different circuit topologies. A first counter is coupled to receive an output signal from the first ring oscillator, while a second counter is coupled to receive an output signal from the second ring oscillator. The sensor circuit further includes a local clock circuit that provides a clock signal to the first and second counters. Furthermore, the local clock circuit is coupled to provide the clock signal exclusively to circuitry within the sensor circuit, the circuitry including the first and second counters.

Abstract: A sensor circuit and integrated circuit having the same is disclosed. In one embodiment, a sensor circuit includes first and second ring oscillators having different circuit topologies. A first counter is coupled to receive an output signal from the first ring oscillator, while a second counter is coupled to receive an output signal from the second ring oscillator. The sensor circuit further includes a local clock circuit that provides a clock signal to the first and second counters. Furthermore, the local clock circuit is coupled to provide the clock signal exclusively to circuitry within the sensor circuit, the circuitry including the first and second counters.

Abstract: A method can include receiving formation parameter values associated with a bore of a formation via a pressure transient analysis of a test performed by tubing that is operatively coupled to a tool that includes at least one pressure sensor. The method can include receiving a pressure stabilization value for fluid flow at a location in the bore of the formation. And, the method can include, based at least in part on the formation parameter values and the pressure stabilization value, calculating a skin factor value for the location in the bore.

Abstract: Actual distributed temperature sensing (DTS) data and pressure data are received in response to a stimulation treatment applied to a hydrocarbon field. A pre-stimulation model is built that includes reservoir parameters, which generates simulated DTS and pressure data as a function of the reservoir parameters that include a permeability parameter and a skin parameter. In response to determining that a thermal match between the actual DTS and pressure data and the simulated DTS and pressure data is not obtained, the reservoir parameters are updated. In response to determining that the updated reservoir parameters do not match a performed pressure transient analysis (PTA), the reservoir parameters and the pre-stimulation model are updated, and the simulated DTS and pressure data are re-generated based on the updated pre-stimulation model.

Abstract: A method can include receiving formation parameter values associated with a bore of a formation; receiving a pressure stabilization value for fluid flow at a location in the bore of the formation; and, based at least in part on the formation parameter values and the pressure stabilization value, calculating a skin factor value for the location in the bore.

Abstract: A continuous-time delta-sigma analog-to-digital converter (ADC) is disclosed. The ADC includes a loop filter, a loop quantizer, and a clock-jitter tolerant digital-to-analog converter (DAC). The clock-jitter tolerant DAC includes a dual switched-current (SI) DAC, a switched-capacitor (SC) DAC, an adder, and a switched-capacitor-resistor (SCR) injection circuit. The dual SI DAC provides two identical analog signals from the feedback digital signal of a loop quantizer within the ADC. The SC DAC provides an error-free reference signal from the feedback digital signal. The adder subtracts one of the two analog signals from the error-free reference signal to obtain an inverted jitter-induced error signal. The SCR injection circuit then injects the inverted jitter-induced error signal, delayed by one clock-cycle, in the form of a half-delay return-to-zero exponentially decaying waveform into the loop filter.

Abstract: A continuous-time delta-sigma analog-to-digital converter (ADC) is disclosed. The ADC includes a loop filter, a loop quantizer, and a clock-jitter tolerant digital-to-analog converter (DAC). The clock-jitter tolerant DAC includes a dual switched-current (SI) DAC, a switched-capacitor (SC) DAC, an adder, and a switched-capacitor-resistor (SCR) injection circuit. The dual SI DAC provides two identical analog signals from the feedback digital signal of a loop quantizer within the ADC. The SC DAC provides an error-free reference signal from the feedback digital signal. The adder subtracts one of the two analog signals from the error-free reference signal to obtain an inverted jitter-induced error signal. The SCR injection circuit then injects the inverted jitter-induced error signal, delayed by one clock-cycle, in the form of a half-delay return-to-zero exponentially decaying waveform into the loop filter.