Patents by Inventor Ranauld Perez

Ranauld Perez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated circuit contactor for testing ICs and method of construction
    Patent number: 11209458
    Abstract: The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are protected against damage from balls on a DUT by a protective ball guide which includes recesses for receiving part of the ball but prevents the ball from driving the pins beyond a limited range. The ball guide provides fine alignment horizontally and vertically enabling stable electrical performance.
    Type: Grant
    Filed: July 27, 2020
    Date of Patent: December 28, 2021
    Assignee: JOHNSTECH INTERNATIONAL CORPORATION
    Inventors: John Nelson, Ranauld Perez, Jeffrey Sherry, Michael Andres, David Johnson
  • Integrated Circuit Contactor For Testing ICs And Method Of Construction
    Publication number: 20200363451
    Abstract: The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are protected against damage from balls on a DUT by a protective ball guide which includes recesses for receiving part of the ball but prevents the ball from driving the pins beyond a limited range. The ball guide provides fine alignment horizontally and vertically enabling stable electrical performance.
    Type: Application
    Filed: July 27, 2020
    Publication date: November 19, 2020
    Inventors: John Nelson, Ranauld Perez, Jeffrey Sherry, Michael Andres, David Johnson
  • Integrated circuit contactor for testing ICs and method of construction
    Patent number: 10725069
    Abstract: The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are protected against damage from balls on a DUT by a protective ball guide which includes recesses for receiving part of the ball but prevents the ball from driving the pins beyond a limited range. The ball guide provides fine alignment horizontally and vertically enabling stable electrical performance.
    Type: Grant
    Filed: September 18, 2018
    Date of Patent: July 28, 2020
    Assignee: JOHNSTECH INTERNATIONAL CORPORATION
    Inventors: John Nelson, Ranauld Perez, Jeffrey Sherry, Michael Andres, David Johnson