Abstract: An optical coherence analysis system uses a laser swept source that is constrained to operate in a stable mode locked condition by modulating a drive current to the semiconductor optical amplifier as function of wavelength or synchronously with the drive voltage of the laser's tunable element based on stability map for the laser.

Abstract: An optical coherence analysis system uses a laser swept source that is constrained to operate in a stable mode locked condition by modulating a drive current to the semiconductor optical amplifier as function of wavelength or synchronously with the drive voltage of the laser's tunable element based on stability map for the laser.

Abstract: An optical detector system comprises a hermetic optoelectronic package, an optical bench installed within the optoelectronic package, a balanced detector system installed on the optical bench. The balanced detector system includes at least two optical detectors that receive interference signals. An electronic amplifier system installed within the optoelectronic package amplifies an output of at least two optical detectors. Also disclosed is an integrated optical coherence tomography system. Embodiments are provided in which the amplifiers, typically transimpedance amplifiers, are closely integrated with the optical detectors that detect the interference signals from the interferometer. Further embodiments are provided in which the interferometer but also preferably its detectors are integrated together on a common optical bench. Systems that have little or no optical fiber can thus be implemented.

Abstract: An optical coherence analysis system uses a laser swept source that is constrained to operate in a stable mode locked condition by modulating a drive current to the semiconductor optical amplifier as function of wavelength or synchronously with the drive voltage of the laser's tunable element based on stability map for the laser.

Abstract: An optical coherence analysis system uses a laser swept source that is constrained to operate in a stable mode locked condition by modulating a drive current to the semiconductor optical amplifier as function of wavelength or synchronously with the drive voltage of the laser's tunable element based on stability map for the laser.

Abstract: An optical detector system comprises a hermetic optoelectronic package, an optical bench installed within the optoelectronic package, a balanced detector system installed on the optical bench. The balanced detector system includes at least two optical detectors that receive interference signals. An electronic amplifier system installed within the optoelectronic package amplifies an output of at least two optical detectors. Also disclosed is an integrated optical coherence tomography system. Embodiments are provided in which the amplifiers, typically transimpedance amplifiers, are closely integrated with the optical detectors that detect the interference signals from the interferometer. Further embodiments are provided in which the interferometer but also preferably its detectors are integrated together on a common optical bench. Systems that have little or no optical fiber can thus be implemented.

Abstract: A detector system for a fiber optic component is insensitive to stray light. Specifically, the invention comprises a detector chip, which converts received light into an electric signal. A baffle substrate is positioned over the detector chip. This baffle substrate has a transmission port through which an optical signal is transmitted to the detector chip. As a result, light that is not directed to be transmitted through the port is blocked by the baffle substrate. In this way, it rejects stray light that may be present in the hermetic package. A detector substrate is provided on which the detector chip is mounted. This detector substrate preferably comprises electrical traces to which the detector chip is electrically connected. The detector substrate can further comprise bond pads for wire bonding to make electrical connections to the electrical traces.

Abstract: A method and system for controlling the temperature of the single mode fiber connectors and single mode, polarization maintaining fiber connectors, which that are used in the semiconductor source spectroscopy systems, is described to stabilize the system against baseline drift. Research and modeling has identified the source of thermally induced shifting to the single mode fiber connectors and single mode, polarization maintaining fiber connectors that are used to assemble the semiconductor source spectroscopy systems.

Abstract: A method and system for controlling the temperature of the single mode fiber connectors and single mode, polarization maintaining fiber connectors, which that are used in the semiconductor source spectroscopy systems, is described to stabilize the system against baseline drift. Research and modeling has identified the source of thermally induced shifting to the single mode fiber connectors and single mode, polarization maintaining fiber connectors that are used to assemble the semiconductor source spectroscopy systems.

Abstract: A micro-optical train manufacturing process includes a step of characterizing the position of optical components on an optical bench, typically using a metrology system. These optical components are then aligned with respect to each other in a passive alignment step based on data from the metrology system and optical system design information. As a result, a subsequent active align process can be avoided in some situations, or if a subsequent active alignment process is performed, the time required for that active alignment process can be reduced because of this initial metrology-based passive alignment step.

Abstract: A micro-optical train manufacturing process includes a step of characterizing the position of optical components on an optical bench, typically using a metrology system. These optical components are then aligned with respect to each other in a passive alignment step based on data from the metrology system and optical system design information. As a result, a subsequent active align process can be avoided in some situations, or if a subsequent active alignment process is performed, the time required for that active alignment process can be reduced because of this initial metrology-based passive alignment step.

Abstract: A process for tunable filter train alignment comprises detecting a spectral response of the filter train and aligning an optical fiber that transmits an input optical signal to the filter train during operation. Further, the tunable filter is moved relative to the filter train in response to a spectral response of the filter train. As a result, the alignment and spectral response of the tunable filter train are optimized. In the preferred embodiment, the alignment and SMSR optimization occur simultaneously with respect to each other.

Abstract: A detector system for a fiber optic component is insensitive to stray light. Specifically, the invention comprises a detector chip, which converts received light into an electric signal. A baffle substrate is positioned over the detector chip. This baffle substrate has a transmission port through which an optical signal is transmitted to the detector chip. As a result, light that is not directed to be transmitted through the port is blocked by the baffle substrate. In this way, it rejects stray light that may be present in the hermetic package. A detector substrate is provided on which the detector chip is mounted. This detector substrate preferably comprises electrical traces to which the detector chip is electrically connected. The detector substrate can further comprise bond pads for wire bonding to make electrical connections to the electrical traces.

Abstract: A process for tunable filter train alignment comprises detecting a spectral response of the filter train and aligning an optical fiber that transmits an input optical signal to the filter train during operation. Further, the tunable filter is moved relative to the filter train in response to a spectral response of the filter train. As a result, the alignment and spectral response of the tunable filter train are optimized. In the preferred embodiment, the alignment and SMSR optimization occur simultaneously with respect to each other.

Abstract: A process for tunable filter train alignment comprises detecting a spectral response of the filter train and aligning an optical fiber that transmits an input optical signal to the filter train during operation. Further, the tunable filter is moved relative to the filter train in response to a spectral response of the filter train. As a result, the alignment and spectral response of the tunable filter train are optimized. In the preferred embodiment, the alignment and SMSR optimization occur simultaneously with respect to each other.

Abstract: A process for assembling micro-optical systems, such as optoelectronic and/or fiber optic components uses solder self-alignment to achieve a coarse, passive alignment of optical components relative to the optical bench. The fine, final alignment is performed using plastic deformation of the optical components to thereby improve the alignment of the optical components. As a result, the sub-micrometer alignment accuracies are attainable, if required.

Abstract: A process for tunable filter train alignment comprises detecting a spectral response of the filter train and aligning an optical fiber that transmits an input optical signal to the filter train during operation. Further, the tunable filter is moved relative to the filter train in response to a spectral response of the filter train. As a result, the alignment and spectral response of the tunable filter train are optimized. In the preferred embodiment, the alignment and SMSR optimization occur simultaneously with respect to each other.

Abstract: A process for assembling micro-optical systems, such as optoelectronic and/or fiber optic components uses solder self-alignment to achieve a coarse, passive alignment of optical components relative to the optical bench. The fine, final alignment is performed using plastic deformation of the optical components to thereby improve the alignment of the optical components. As a result, the sub-micrometer alignment accuracies are attainable, if required.

Abstract: A magnetically-assisted fixturing process for optical components on a bench utilizes precision placement of an optical component on a bench. This placement can be done either entirely passively, actively, or using a combination of active and passive alignment. The optical component is then held on the bench using a magnetic field. Thus, the optical component is maintained in a stable relationship with respect to the bench, especially after it has been aligned. The optical component is then affixed to the bench, typically by a solder bonding process. Alternatively, other bonding processes can be used, such as epoxy bonding or laser welding. In one implementation, the magnetic fixturing is maintained during the process of affixing or bonding the optical component. Thus, in one example, the optical bench can be transported to a solder reflow oven while the optical component is held on the bench via the magnetic fixturing.

Abstract: A process for assembling micro-optical systems, such as optoelectronic and/or fiber optic components uses solder self-alignment to achieve a coarse, passive alignment of optical components relative to the optical bench. The fine, final alignment is performed using plastic deformation of the optical components to thereby improve the alignment of the optical components. As a result, the sub-micrometer alignment accuracies are attainable, if required.