Patents by Inventor Randall G. Percival

Randall G. Percival has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ion sources, systems and methods
    Patent number: 9236225
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: April 13, 2015
    Date of Patent: January 12, 2016
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • ION SOURCES, SYSTEMS AND METHODS
    Publication number: 20150213997
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Application
    Filed: April 13, 2015
    Publication date: July 30, 2015
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Ion sources, systems and methods
    Patent number: 9029765
    Abstract: Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like). In certain embodiments, the ion sources, systems and methods can enhance the ability to make tips having desired physical attributes (e.g., the number of atoms on the apex of the tip). This can enhance performance (e.g., increase reliability, stability and the like).
    Type: Grant
    Filed: May 13, 2013
    Date of Patent: May 12, 2015
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Richard Comunale, Alexander Groholski, John A. Notte, IV, Randall G. Percival, Billy W. Ward
  • Ion sources, systems and methods
    Patent number: 9012867
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: May 23, 2014
    Date of Patent: April 21, 2015
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Charged particle source with light monitoring for tip temperature determination
    Patent number: 8993981
    Abstract: Systems and methods for heating an apex of a tip of a charged particle source are disclosed. The charged particle source can be, for example, a gas ion source. The systems can include a detector configured to detect light generated by the tip apex, and a controller coupled with the charged particle source and the detector so that the controller can control heating of the tip apex based on the light detected by the detector.
    Type: Grant
    Filed: October 20, 2011
    Date of Patent: March 31, 2015
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: John Notte, IV, Randall G. Percival, Milton Rahman, Louise Barriss, Russell Mello, Mark D. DiManna
  • ION SOURCES, SYSTEMS AND METHODS
    Publication number: 20140306121
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Application
    Filed: May 23, 2014
    Publication date: October 16, 2014
    Applicant: Carl Zeiss Microscopy, LLC
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Ion sources, systems and methods
    Patent number: 8748845
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: January 24, 2012
    Date of Patent: June 10, 2014
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Billy W. Ward, John A. Notte, Louis S. Farkas, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Gas delivery system with voltage gradient for an ion microscope
    Patent number: 8558192
    Abstract: Disclosed are systems and methods for applying a voltage gradient to a gas delivery system, delivering a gas through a length of the gas delivery system having the voltage gradient, the gas having a pressure-distance product of less than about 1×10?2 Torr-inches or greater than about 100 Torr-inches, and delivering the gas into a housing of an ion microscope, the housing including an emitter and an extractor.
    Type: Grant
    Filed: October 19, 2011
    Date of Patent: October 15, 2013
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Billy W. Ward, John Notte, IV, Randall G. Percival
  • ION SOURCES, SYSTEMS AND METHODS
    Publication number: 20130256532
    Abstract: Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like). In certain embodiments, the ion sources, systems and methods can enhance the ability to make tips having desired physical attributes (e.g., the number of atoms on the apex of the tip). This can enhance performance (e.g., increase reliability, stability and the like).
    Type: Application
    Filed: May 13, 2013
    Publication date: October 3, 2013
    Applicant: Carl Zeiss Microscopy, LLC
    Inventors: Richard Comunale, Alexander Groholski, John A. Notte, IV, Randall G. Percival, Billy W. Ward
  • GAS DELIVERY IN A MICROSCOPE SYSTEM
    Publication number: 20120145896
    Abstract: Disclosed are systems and methods for applying a voltage gradient to a gas delivery system, delivering a gas through a length of the gas delivery system having the voltage gradient, the gas having a pressure-distance product of less than about 1×010?2 Torr-inches or greater than about 100 Torr-inches, and delivering the gas into a housing of an ion microscope, the housing including an emitter and an extractor.
    Type: Application
    Filed: October 19, 2011
    Publication date: June 14, 2012
    Applicant: Carl Zeiss NTS, LLC
    Inventors: Billy W. Ward, John Notte, IV, Randall G. Percival
  • ION SOURCES, SYSTEMS AND METHODS
    Publication number: 20120141693
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Application
    Filed: January 24, 2012
    Publication date: June 7, 2012
    Applicant: ALIS CORPORATION
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • METHODS AND SYSTEMS FOR HEATING A TIP APEX OF A CHARGED PARTICLE SOURCE
    Publication number: 20120074318
    Abstract: Systems and methods for heating an apex of a tip of a charged particle source are disclosed. The charged particle source can be, for example, a gas ion source. The systems can include a detector configured to detect light generated by the tip apex, and a controller coupled with the charged particle source and the detector so that the controller can control heating of the tip apex based on the light detected by the detector.
    Type: Application
    Filed: October 20, 2011
    Publication date: March 29, 2012
    Applicant: CARL ZEISS NTS, LLC
    Inventors: John Notte, IV, Randall G. Percival, Milton Rahman, Louise Barriss, Russell Mello, Mark D. DiManna
  • Ion sources, systems and methods
    Patent number: 8110814
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: February 2, 2009
    Date of Patent: February 7, 2012
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Ion sources, systems and methods
    Patent number: 7786451
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: August 31, 2010
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Alexander Groholski, Richard Comunale
  • Ion sources, systems and methods
    Patent number: 7786452
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: August 31, 2010
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill
  • Ion sources, systems and methods
    Patent number: 7745801
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: June 29, 2010
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Alexander Groholski, Richard Comunale
  • Systems and methods for a gas field ion microscope
    Patent number: 7601953
    Abstract: In one aspect the invention provides a gas field ion microscope that includes an ion source in connection with an optical column, such that an ion beam generated at the ion source travels through the optical column and impinges on a sample. The ion source includes an emitter having a width that tapers to a tip comprising a few atoms. In other aspects, the invention provides methods for using the ion microscope to analyze samples and enhancing the performance of a gas field ion source.
    Type: Grant
    Filed: March 20, 2006
    Date of Patent: October 13, 2009
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, Louis S. Farkas, III, John A. Notte, IV, Randall G. Percival
  • Ion sources, systems and methods
    Patent number: 7557359
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: July 7, 2009
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill
  • Ion sources, systems and methods
    Patent number: 7557361
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: July 7, 2009
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill
  • Ion sources, systems and methods
    Patent number: 7557360
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: July 7, 2009
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Lars Markwort, Dirk Aderhold