Patents by Inventor Randall Geiger

Randall Geiger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • TEMPERATURE SENSOR ARRAY AND MICRO-HEATER THERMAL CALIBRATION
    Publication number: 20230417607
    Abstract: Various embodiments disclosed herein provide for an improved method for sensing the temperature at an individual sensor location that is both small in size, and the temperature can be determined independent of the temperature of the Temperature Management Controller (TMC). The method includes determining the temperature at the temperature sensing element or circuit based on a function of two voltages measured at the temperature sensing element. In a first embodiment, the two voltages are measured at two transistors that are each being supplied with the same current.
    Type: Application
    Filed: September 23, 2022
    Publication date: December 28, 2023
    Inventors: Randall Geiger, Degang James Chen, Pallavi Sugantha Ebenezer, Ruohan Yang, Bryce Sena Gadogbe, Kwabena Oppong Banahene, Douglas Ambrose Zuercher
  • Method for testing analog and mixed-signal circuits using functionally related excitations and functionally related measurements
    Patent number: 7129734
    Abstract: A method for testing a circuit includes determining at least one performance characteristic of the circuit based on a functional relationship between excitation signals or on a functional relationship between measurement devices. The method is implemented either as a part of a built-in self test circuit of an integrated circuit or for production testing.
    Type: Grant
    Filed: May 21, 2004
    Date of Patent: October 31, 2006
    Assignees: Iowa State University Research Foundation, Inc., Texas Instruments, Inc.
    Inventors: Randall Geiger, Kumar Parthasarathy, Degang Chen, Le Jin, Turker Kuyel
  • Method for testing analog and mixed-signal circuits using functionally related excitations and functionally related measurements
    Publication number: 20050088164
    Abstract: A method for testing a circuit includes determining at least one performance characteristic of the circuit based on a functional relationship between excitation signals or on a functional relationship between measurement devices. The method is implemented either as a part of a built-in self test circuit of an integrated circuit or for production testing.
    Type: Application
    Filed: May 21, 2004
    Publication date: April 28, 2005
    Applicant: Iowa State University Research Foundation, Inc.
    Inventors: Randall Geiger, Kumar Parthasarathy, Degang Chen, Le Jin, Turker Kuyel
  • Method for testing analog and mixed-signal circuits using dynamic element matching for source linearization
    Publication number: 20050057271
    Abstract: A method of testing an analog and/or mixed-signal circuit can be used in either a production or a built-in self test environment. The method includes generating an excitation signal for testing by using dynamic element matching for performance enhancement of the test signal generator that applies an excitation, and/or by measuring an output of the DUT using dynamic element matching for performance enhancement of an output measurement device. Signal generators and circuits using aspects of the method are also discussed.
    Type: Application
    Filed: July 30, 2004
    Publication date: March 17, 2005
    Inventors: Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall Geiger