Patents by Inventor Randall H. Field

Randall H. Field has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Dual eddy current probe for detecting geometrical differences especially as related to threaded apertures and studs
    Patent number: 6703831
    Abstract: An apparatus and method for inspecting contours formed along a predetermined region of a surface on a workpiece formed of an electrically conductive material using eddy current. A probe includes a longitudinal axis and is moveable along a path of travel with respect to the predetermined region to be inspected on a workpiece. At least two coils are spaced longitudinally from one another and supported by the probe to be electrically excited with a predetermined frequency and amplitude during movement of the probe along the path. Sensors are provided for measuring the excitation voltage of each coil as eddy currents are induced in the electrically conductive material of the workpiece by the coils supported on the probe moving along the path of travel with respect to the workpiece.
    Type: Grant
    Filed: October 3, 2000
    Date of Patent: March 9, 2004
    Assignee: Quantech, Inc.
    Inventors: William A. Keely, Randall H. Field