Abstract: An apparatus, system, and method are disclosed for detecting temperature threshold events in an aftertreatment device. The system may include an aftertreatment device configured to treat an exhaust gas of an internal combustion engine and a temperature responder disposed within a region of interest of the aftertreatment device. The temperature responder is configured to melt at a threshold temperature. The system may further include two access points electrically coupled to the temperature responder and an observation module configured to measure an electrical resistance value across the two access points. The observation module detects the melting of the temperature responder based on the electrical resistance value measured across the access points. In alternate embodiments the observation module is included within an engine control module (ECM) or a service tool.

Abstract: An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.

Abstract: An apparatus, system, and method are disclosed for determining a time-temperature history of an aftertreatment device. The apparatus includes an aftertreatment device comprising a substrate, and at least one thermal monitoring member (TMM) in thermal contact with the substrate. The TMMs may comprise a material that exhibits an electrical resistivity change at temperature over time. The apparatus may include a controller configured to measure the electrical resistivity of at least a portion of the TMMs, and to determine a thermal history based on the electrical resistivity measures.

Abstract: An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.

Abstract: An apparatus, system, and method are disclosed for detecting temperature threshold events in an aftertreatment device. The system may include an aftertreatment device configured to treat an exhaust gas of an internal combustion engine and a temperature responder disposed within a region of interest of the aftertreatment device. The temperature responder is configured to melt at a threshold temperature. The system may further include two access points electrically coupled to the temperature responder and an observation module configured to measure an electrical resistance value across the two access points. The observation module detects the melting of the temperature responder based on the electrical resistance value measured across the access points. In alternate embodiments the observation module is included within an engine control module (ECM) or a service tool.

Abstract: An apparatus, system, and method are disclosed for determining a time-temperature history of an aftertreatment device. The apparatus includes an aftertreatment device comprising a substrate, and at least one thermal monitoring member (TMM) in thermal contact with the substrate. The TMMs may comprise a material that exhibits an electrical resistivity change at temperature over time. The apparatus may include a controller configured to measure the electrical resistivity of at least a portion of the TMMs, and to determine a thermal history based on the electrical resistivity measures.

Abstract: A fluid pump including provisions for cooling and/or flushing in the vicinity of a static seal. In one embodiment, the invention includes an open channel fluid passageway defined on a generally flat surface of a pump housing. A centrifugal rotor with a generally flat backplate rotates proximate a surface of the housing. The fluid passageways are adapted and configured to have a pathway that includes a directional component parallel to the direction of rotation, such that fluid drag from the rotating backplate induces flow within the passageway. The passages of the exit can be positioned such that flow exiting the passageway is at least partly tangential to the seal and/or the seal housing.

Abstract: A fluid pump including provisions for cooling and/or flushing in the vicinity of a static seal. In one embodiment, the invention includes an open channel fluid passageway defined on a generally flat surface of a pump housing. A centrifugal rotor with a generally flat backplate rotates proximate a surface of the housing. The fluid passageways are adapted and configured to have a pathway that includes a directional component parallel to the direction of rotation, such that fluid drag from the rotating backplate induces flow within the passageway. The passages of the exit can be positioned such that flow exiting the passageway is at least partly tangential to the seal and/or the seal housing.