Abstract: A circuit testing approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths. According to an example embodiment of the present invention, a configurator arrangement (100) is programmed to control a configured circuit (110), the control including automatically setting switches (115) on the configured circuit. In one implementation, the configurator arrangement is programmed to automatically detect test signals (i.e., digital and/or JTAG test signals) and to control switches (115) for routing test data along a test circuit path. With this approach, manual switching for routing the test signals is not necessary, which has been found to be useful in applications where access to the circuit paths for switching is difficult or impossible.

Abstract: A circuit testing approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths. According to an example embodiment of the present invention, a configurator arrangement (100) controls a configured circuit (110) by monitoring test signals and, in response, setting switches (115) on the configured circuit. In one implementation, the configurator circuit arrangement is programmed to automatically detect test signals (i.e., digital and/or JTAG test signals) and to control switches (115) for routing test data along a test circuit path on the configured circuit and/or between the configured circuit and an external circuit. With this approach, manual switching for routing the test signals is not necessary, which has been found to be useful in applications where access to the circuit paths for switching is difficult or impossible.

Abstract: A circuit testing approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths. According to an example embodiment of the present invention, a configurator arrangement (100) is programmed to control a configured circuit (110), the control including automatically setting switches (115) on the configured circuit. In one implementation, the configurator arrangement is programmed to automatically detect test signals (i.e., digital and/or JTAG test signals) and to control switches (115) for routing test data along a test circuit path. With this approach, manual switching for routing the test signals is not necessary, which has been found to be useful in applications where access to the circuit paths for switching is difficult or impossible.