Patents by Inventor Randy Bartels

Randy Bartels has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10073025
    Abstract: Systems and methods are disclosed to determine the axial and/or lateral location of a particle using light modulated with temporal and/or spatial modulation pattern. The system, for example, may include a modulator configured to temporally modulate an intensity pattern of a line of light uniquely at each point along a lateral length of the line of light and produce an undiffracted modulated line of light, a first first-order diffracted line of light, and a second first-order diffracted line of light; and one or more optical elements configured to direct the undiffracted line of light and one of the first first-order diffracted line of light and the second first-order diffracted line of light toward at least one particle disposed at or near a sample region. The system may include a processor configured to determine an axial and/or a lateral position of the particle disposed at or near the sample region.
    Type: Grant
    Filed: March 24, 2015
    Date of Patent: September 11, 2018
    Assignee: Colorado State University Research Foundation
    Inventors: Randy Bartels, Jeffrey J. Field, David G. Winters
  • Publication number: 20170184483
    Abstract: Systems and methods are disclosed to determine the axial and/or lateral location of a particle using light modulated with temporal and/or spatial modulation pattern. The system, for example, may include a modulator configured to temporally modulate an intensity pattern of a line of light uniquely at each point along a lateral length of the line of light and produce an undiffracted modulated line of light, a first first-order diffracted line of light, and a second first-order diffracted line of light; and one or more optical elements configured to direct the undiffracted line of light and one of the first first-order diffracted line of light and the second first-order diffracted line of light toward at least one particle disposed at or near a sample region. The system may include a processor configured to determine an axial and/or a lateral position of the particle disposed at or near the sample region.
    Type: Application
    Filed: March 24, 2015
    Publication date: June 29, 2017
    Inventors: Randy Bartels, Jeffrey J. Field, David G. Winters