Abstract: The methodology includes a single excitation analysis, a multi-excitation analysis, and a simultaneous switch noise, SSN, analysis. A chip connects to the PDS at a plurality of power ports formed by pads for obtaining biasing voltage and current from those power ports. The single excitation analysis includes respectively making each of power ports start conducting current, and measuring a voltage provided by the power port. An equivalent impedance of each power port is obtained. The multi-excitation analysis includes making a given power port conduct a given current, and measuring voltages at other power ports for evaluating mutual couplings across different power ports. The SSN analysis includes respectively making different numbers of power ports conduct currents and accordingly evaluating different equivalent impedances corresponding to different SSN situations.

Abstract: The methodology includes a single excitation analysis, a multi-excitation analysis, and a simultaneous switch noise, SSN, analysis. A chip connects to the PDS at a plurality of power ports formed by pads for obtaining biasing voltage and current from those power ports. The single excitation analysis includes respectively making each of power ports start conducting current, and measuring a voltage provided by the power port. An equivalent impedance of each power port is obtained. The multi-excitation analysis includes making a given power port conduct a given current, and measuring voltages at other power ports for evaluating mutual couplings across different power ports. The SSN analysis includes respectively making different numbers of power ports conduct currents and accordingly evaluating different equivalent impedances corresponding to different SSN situations.

Abstract: An extended flip chip ball grid array package includes a metal heat slug bonded to the surface of a semiconductor chip. The heat slug has a bonding structure for connecting itself and a BGA substrate panel on which the semiconductor chip is mounted. The heat slug protects the chip from being damaged as well as assists heat dissipation. A first package assembly provides contact bodies on the heat slug for bonding the heat slug to contact pads formed on a BGA substrate panel. A second package assembly fixes the heat slug to a supporting structure bonded on a BGA substrate panel. Supporting stubs are formed on the supporting structure and snapped in openings formed on the contact bodies of the heat slug. Conventional packaging or testing equipment can be used for both package assemblies to manufacture or test the semiconductor chip packages.

Abstract: A lead frame having protection against electrostatic discharge is disclosed. The lead frame having protection against electrostatic discharge includes a multiplicity of leads and an electrostatic discharge protection device. The electrostatic discharge protection device includes a conductive layer and a protection layer. The protection layer is arranged to contact a plurality of leads and is formed from an electrostatic discharge protection material, which insulates the leads from the conductive layer at voltages below a predefined threshold voltage and establishes an electrical connection between the leads and the conductive layer at voltages above the threshold voltage.

Abstract: Described is a circuit board having protection against electrostatic discharge. The board includes a plurality of interconnect traces and an electrically conductive ground plane formed on a substrate such that a gap is created between the interconnect traces and the ground plane. A resistive electrostatic discharge protection material is positioned to bridge the gaps between the ground plane and the interconnect traces, such that the electrostatic discharge protection material electrically insulates the interconnect traces from the ground plane at voltages below a predefined threshold voltage and establishes an electrical connection between the interconnect traces and the conductive plane at voltages above the threshold voltage. A process of manufacturing the circuit board includes forming interconnect traces and a ground plane such that there is a gap between the ground plane and the interconnect traces.

Abstract: A lead frame having protection against electrostatic discharge is disclosed. The lead frame having protection against electrostatic discharge includes a multiplicity of leads and an electrostatic discharge protection device. The electrostatic discharge protection device includes a conductive layer and a protection layer. The protection layer is arranged to contact a plurality of leads and is formed from an electrostatic discharge protection material, which insulates the leads from the conductive layer at voltages below a predefined threshold voltage and establishes an electrical connection between the leads and the conductive layer at voltages above the threshold voltage.