Abstract: An apparatus is described having a latch circuit. The latch circuit includes redundant data inputs, redundant data outputs, redundant clock inputs and circuitry to self-correct a soft-error.

Abstract: An apparatus is described having a latch circuit. The latch circuit includes redundant data inputs, redundant data outputs, redundant clock inputs and circuitry to self-correct a soft-error.

Abstract: Embodiments of the present invention may provide methods and circuits for energy efficient floating point multiply and/or add operations. A variable precision floating point circuit may determine the certainty of the result of a multiply-add floating point calculation in parallel with the floating-point calculation. The variable precision floating point circuit may use the certainty of the inputs in combination with information from the computation, such as, binary digits that cancel, normalization shifts, and rounding, to perform a calculation of the certainty of the result. A floating point multiplication circuit may determine whether a lowest portion of a multiplication result could affect the final result and may induce a replay of the multiplication operation when it is determined that the result could affect the final result.

Abstract: Embodiments of the present invention may provide methods and circuits for energy efficient floating point multiply and/or add operations. A variable precision floating point circuit may determine the certainty of the result of a multiply-add floating point calculation in parallel with the floating-point calculation. The variable precision floating point circuit may use the certainty of the inputs in combination with information from the computation, such as, binary digits that cancel, normalization shifts, and rounding, to perform a calculation of the certainty of the result. A floating point multiplication circuit may determine whether a lowest portion of a multiplication result could affect the final result and may induce a replay of the multiplication operation when it is determined that the result could affect the final result.

Abstract: In some embodiments, complementary charge-collecting diffusions (transistor diffusions, e.g., drain or source areas) are disposed close to each other. In some embodiments, dummy (“off”) transistors are incorporated to bring complementary diffusions (diffusions of the same charge type and having complementary digital logic levels) closer to each other than otherwise might be possible and thus, to enhance common-mode charge collection for the complementary diffusion areas.

Abstract: In some embodiments, complementary charge-collecting diffusions (transistor diffusions, e.g., drain or source areas) are disposed close to each other. In some embodiments, dummy (“off”) transistors are incorporated to bring complementary diffusions (diffusions of the same charge type and having complementary digital logic levels) closer to each other than otherwise might be possible and thus, to enhance common-mode charge collection for the complementary diffusion areas.

Abstract: A sense amplifier is provided for sensing an input voltage level of a data signal. Such a sense amplifier pre-charges, and subsequently discharges, a pair of nodes through a respective pair of discharge paths. Each of those discharge paths is capable of performing the discharge operation at a rate that is related to either a system voltage supply or an input logic level of the data signal. Because the discharge path that is associated with the data signal includes a greater amount of conductance, it can perform the discharge operation at a faster rate, even where the input logic level does not exceed the voltage of the system voltage supply. A determination is made as to which of the discharge is the faster and, responsively, a rail-to-rail output signal having the same polarity as the data signal, is generated. The input data signal is conveyed to the sense amplifier by a single wire. Also, the sense amplifier does not require a specialized reference voltage for proper operation.

Abstract: A sense amplifier is provided for sensing an input voltage level of a data signal. Such a sense amplifier pre-charges, and subsequently discharges, a pair of nodes through a respective pair of discharge paths. Each of those discharge paths is capable of performing the discharge operation at a rate that is related to either a system voltage supply or an input logic level of the data signal. Because the discharge path that is associated with the data signal includes a greater amount of conductance, it can perform the discharge operation at a faster rate, even where the input logic level does not exceed the voltage of the system voltage supply. A determination is made as to which of the discharge is the faster and, responsively, a rail-to-rail output signal having the same polarity as the data signal, is generated. The input data signal is conveyed to the sense amplifier by a single wire. Also, the sense amplifier does not require a specialized reference voltage for proper operation.

Abstract: A sense amplifier for sensing an input voltage level of a data signal. Such a sense amplifier pre-charges, and subsequently discharges, a pair of nodes through a respective pair of discharge paths. Each of those discharge paths is capable of performing the discharge operation at a rate that is related to either a system voltage supply or an input logic level of the data signal. Because the discharge path that is associated with the data signal includes a greater amount of conductance, it can perform the discharge operation at a faster rate, even where the input logic level does not exceed the voltage of the system voltage supply. A determination is made as to which of the discharge is the faster and, responsively, a rail-to-rail output signal having the same polarity as the data signal, is generated.