Abstract: An apparatus is provided that is implemented to enable multiple tests of different types, such as a direct current (DC) test and/or a radio frequency (RF) test of a semiconductor device. The apparatus includes a microelectromechanical systems (MEMS) switch block coupled between the semiconductor device and automatic testing equipment (ATE). The apparatus is configured to enable/disable a DC path or an RF path to switch between a DC test and an RF test without reconfiguring the connections between the semiconductor device and the ATE. The DC path is used to perform a DC contact test for one or more pins of the semiconductor device. The RF path is used to perform an RF test for the semiconductor device.

Abstract: An apparatus is provided that is implemented to enable multiple tests of different types, such as a direct current (DC) test and/or a radio frequency (RF) test of a semiconductor device. The apparatus includes a microelectromechanical systems (MEMS) switch block coupled between the semiconductor device and automatic testing equipment (ATE). The apparatus is configured to enable/disable a DC path or an RF path to switch between a DC test and an RF test without reconfiguring the connections between the semiconductor device and the ATE. The DC path is used to perform a DC contact test for one or more pins of the semiconductor device. The RF path is used to perform an RF test for the semiconductor device.

Abstract: An apparatus is provided that is implemented to enable multiple tests of different types, such as a direct current (DC) test and/or a radio frequency (RF) test of a semiconductor device. The apparatus includes a microelectromechanical systems (MEMS) switch block coupled between the semiconductor device and automatic testing equipment (ATE). The apparatus is configured to enable/disable a DC path or an RF path to switch between a DC test and an RF test without reconfiguring the connections between the semiconductor device and the ATE. The DC path is used to perform a DC contact test for one or more pins of the semiconductor device. The RF path is used to perform an RF test for the semiconductor device.

Abstract: The present invention relates to testing cell phones that simulates network conditions. In particular, it relates to new testing capabilities for simulating changes in correlation characteristics of signal components delivered to a cell phone. Correlation characteristics express changing environmental conditions and physical relationships among antennas in the cell phone and at base stations.

Abstract: The present invention relates to testing cell phones that simulates network conditions. In particular, it relates to new testing capabilities for simulating changes in correlation characteristics of signal components delivered to a cell phone. Correlation characteristics express changing environmental conditions and physical relationships among antennas in the cell phone and at base stations.

Abstract: An audio enhancement system and method is provided wherein a wireless headphone system comprises a transmitter and a receiver. The transmitter for this system broadcasts a Direct Sequence Spread Spectrum (DSSS) CDMA signal on a number of separate code channels in the 902-928 MHz ISM band. Each successive code channel will have its audio signal delayed by a preset period, e.g. 30 mS, relative to the previous channel. A reference signal on one or more separate time synchronized code channels will be simultaneously transmitted from multiple dedicated transmitters within the venue. Analysis of these multiple code channels by the electronics in the headset will provide the headset with an approximate radial distance from the stage. The headset receiver, supporting position location signals, and associated hardware will select the appropriate audio code depending on the listener's distance from the main loudspeakers.

Abstract: An audio enhancement system and method is provided wherein a wireless headphone system comprises a transmitter and a receiver including a synchronization device which utilizes electromagnetic locating signals to locate the position of the receiver with respect to the transmitter. The transmitter for this system will broadcast a frequency modulated (FM) signal on a number of separate channels in the 900 MHz band range. Each channel will carry the same audio information, however, each successive channel will have its audio signal delayed by a preset time period, e.g. 50 ms, relative to the previous channel. The headset receiver, supporting position location signals, and associated hardware will select the appropriate channel depending on the listener's distance from the main loudspeakers.