Abstract: A method includes obtaining device data corresponding to a set of electronic devices, the set including a first, second, and third electronic device. The method includes grouping the set of electronic devices into a first cluster and a second cluster, wherein the first cluster includes the first and second electronic devices, and the second cluster includes the third electronic device. The method includes obtaining first signature data comprising one or more first electrical parameters of the first electronic device and second signature data comprising one or more second electrical parameters of the second electronic device. The method includes determining that a first electrical parameter of the first signature data matches a second electrical parameter of the second signature data. The method includes regrouping the set of electronic devices such that the first cluster includes the first electronic device and the second cluster includes the second and third electronic devices.