Abstract: A low latency retimer and a low latency control method are provided; a physical layer module is provided on each of two opposite sides of the retimer; each physical layer module includes at least one set of signal transceiver units including a signal receiving unit and a signal transmitting unit; the signal receiving unit performs a serial-to-parallel conversion on a first high-speed serial signal to generate a parallel signal, and sends the parallel signal to the signal transmitting unit; the signal transmitting unit performs a parallel-to-serial conversion on the parallel signal, to convert the parallel signal to obtain a second high-speed serial signal, and outputs the second high-speed serial signal. Data paths of the retimer form a loopback structure, and the signal transmitting unit and the signal receiving unit are physically adjacent to each other, which solves the problem of signal transmission delay, and avoids high power consumption.

Abstract: A low latency retimer and a low latency control method are provided; a physical layer module is provided on each of two opposite sides of the retimer; each physical layer module includes at least one set of signal transceiver units including a signal receiving unit and a signal transmitting unit; the signal receiving unit performs a serial-to-parallel conversion on a first high-speed serial signal to generate a parallel signal, and sends the parallel signal to the signal transmitting unit; the signal transmitting unit performs a parallel-to-serial conversion on the parallel signal, to convert the parallel signal to obtain a second high-speed serial signal, and outputs the second high-speed serial signal. Data paths of the retimer form a loopback structure, and the signal transmitting unit and the signal receiving unit are physically adjacent to each other, which solves the problem of signal transmission delay, and avoids high power consumption.

Abstract: A test device and method with built-in self-test logic and a communication device. The test device includes at least one generator and at least one checker which are disposed between a physical layer and a medium access control layer. The at least one generator is configured to generate a protocol pattern to form a data path between the physical layer and the medium access control layer, and generate different pseudo random bit sequence patterns in the data path. The at least one checker is configured to test a data stream in the physical layer and/or the medium access control layer according to the pseudo random bit sequence patterns, thereby locating a fault position.

Abstract: The present application discloses a test device and method with built-in self-test logic and a communication device. The test device includes at least one generator and at least one checker which are disposed between a physical layer and a medium access control layer, The at least one generator is configured to generate a protocol pattern to form a data path between the physical layer and the medium access control layer and generate different pseudo random bit sequence patterns in the data path. The at least one checker is configured to test data stream in the physical layer and/or the medium access control layer according to the pseudo random bit sequence patterns, thereby locating a fault position.