Patents by Inventor Raphaël Desbiens

Raphaël Desbiens has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230417656
    Abstract: The present disclosure relates to measuring chemical constituents and associated properties of hydrocarbon fuel mixtures, and further relates to tunable diode laser absorption spectrometry gas analyzers having improved chemometric models.
    Type: Application
    Filed: June 24, 2022
    Publication date: December 28, 2023
    Inventors: Raphaël Desbiens, John Brian Leen, Kyle Owen
  • Publication number: 20230243688
    Abstract: A system for measuring a fill level of a tank is provided. The system includes a sensor disposed in the tank and configured to generate echo data. The system further includes a computing device including a memory configured to store a plurality of historical echo lists and a processor coupled in communication with the sensor. The processor is configured to generate an echo curve based on echo data received from the sensor, generate an echo list by identifying, from the generated echo curve, a plurality of echoes, generate a plurality of echo tracks by comparing the generated echo list to the plurality of historical echo lists, identify a top level echo track from the plurality of echo tracks, the top level echo track having shifted by a threshold distance, and record a current fill level based on the identified top level echo track.
    Type: Application
    Filed: January 31, 2022
    Publication date: August 3, 2023
    Inventors: Yvan Mimeault, Raphael Desbiens, Simon Labrecque
  • Patent number: 11639892
    Abstract: Systems and methods for skewed basis set fitting may include obtaining measured absorption data indicative of an amount of absorption of light by a sample gas at each of multiple frequencies, determining an absorption dependent cavity time constant indicative of a skew to the measured absorption data caused by light reflections within a cavity in which the sample gas is contained, obtaining reference absorption data including basis sets indicative of reference amounts of light absorbed by each of multiple gases at each of the multiple frequencies, skewing the reference absorption data based on the absorption dependent cavity time constant to generate skewed reference absorption data, and fitting the measured absorption data to the skewed reference absorption data to identify an amount of at least one constituent gas within the sample gas.
    Type: Grant
    Filed: April 2, 2021
    Date of Patent: May 2, 2023
    Assignee: ABB SCHWEIZ AG
    Inventors: J. Brian Leen, Kyle Owen, John Savee, Dmitry Skvortsov, Paul Hansen, Raphael Desbiens
  • Publication number: 20220317029
    Abstract: Systems and methods for skewed basis set fitting may include obtaining measured absorption data indicative of an amount of absorption of light by a sample gas at each of multiple frequencies, determining an absorption dependent cavity time constant indicative of a skew to the measured absorption data caused by light reflections within a cavity in which the sample gas is contained, obtaining reference absorption data including basis sets indicative of reference amounts of light absorbed by each of multiple gases at each of the multiple frequencies, skewing the reference absorption data based on the absorption dependent cavity time constant to generate skewed reference absorption data, and fitting the measured absorption data to the skewed reference absorption data to identify an amount of at least one constituent gas within the sample gas.
    Type: Application
    Filed: April 2, 2021
    Publication date: October 6, 2022
    Inventors: J. Brian Leen, Kyle Owen, John Savee, Dmitry Skvortsov, Paul Hansen, Raphael Desbiens
  • Patent number: 8014965
    Abstract: A spectrometric system has a primary channel with a signal waveform and a reference channel with a signal waveform. A digital representation of the primary signal waveform and a digital representation of the reference signal waveform to provide a digital output representing the primary signal at datum points synchronized with the reference signal are processed by computing the Fourier transform of the primary signal waveform and using a fast reverse non-uniform discrete Fourier Transform technique to compute the reverse non-uniform discrete Fourier transform of the Fourier transform of the primary signal waveform to provide the digital output representing the primary signal at datum points synchronized with the reference signal.
    Type: Grant
    Filed: February 21, 2007
    Date of Patent: September 6, 2011
    Assignee: ABB Bomen
    Inventors: Raphaël Desbiens, Henry L. Buijs
  • Publication number: 20080198374
    Abstract: A spectrometric system has a primary channel with a signal waveform and a reference channel with a signal waveform. A digital representation of the primary signal waveform and a digital representation of the reference signal waveform to provide a digital output representing the primary signal at datum points synchronized with the reference signal are processed by computing the Fourier transform of the primary signal waveform and using a fast reverse non-uniform discrete Fourier Transform technique to compute the reverse non-uniform discrete Fourier transform of the Fourier transform of the primary signal waveform to provide the digital output representing the primary signal at datum points synchronized with the reference signal.
    Type: Application
    Filed: February 21, 2007
    Publication date: August 21, 2008
    Inventors: Raphael Desbiens, Henry L. Buijs