Abstract: There is provided an optical-fiber connector endface inspection microscope device that is natively designed for inspecting angled-polished (APC) optical-fiber connectors, i.e., without requiring an angled adapter tip or optical components in the adapter tip to deviate light reflected from the optical-fiber endface. Adapter tips are still needed to adapt the microscope device to different types of connectors, but they are small, straight, and low cost. This can be achieved using optics configured to deviate the illumination path so illumination light exits the inspection microscope device along an illumination path that is at an angle that is substantially egal to 8 degrees, so as to illuminate the connector endface in a direction that is substantially normal to the angled-polished endface to be inspected.

Abstract: There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging the endface of a duplex optical-fiber connector. Because of the distance between the ferrules of a duplex connector, the field of view of a typical single-fiber or multi-fiber inspection microscope may not be wide enough to allow inspection of both ferrules at once. The proposed adapter tip or microscope system may comprise relay optics configured to laterally shift the optical path of the light beam reflected from one optical fiber endface (corresponding the first ferrule) toward that from the other optical fiber endface (corresponding the second ferrule), so that both endfaces may be imaged within the field of view of the inspection microscope.

Abstract: There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging two non-parallel APC optical-fiber endfaces of a duplex (i.e., APC trans-duplex) optical-fiber connector. Because the two optical-fiber endfaces of an APC trans-duplex connector are angled-polished (APC) in different directions (non-parallel), inspection light reflected on the two endfaces take diverging pathways. A single-fiber or multi-fiber inspection microscope therefore cannot allow inspection of both optical-fiber endfaces at once. The proposed adapter tip or microscope system comprises relay optics defining two imaging paths (one for each optical-fiber endface), wherein each imaging path comprises at least one optical component (e.g.

Abstract: There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging the endface of a duplex optical-fiber connector. Because of the distance between the ferrules of a duplex connector, the field of view of a typical single-fiber or multi-fiber inspection microscope may not be wide enough to allow inspection of both ferrules at once. The proposed adapter tip or microscope system may comprise relay optics configured to laterally shift the optical path of the light beam reflected from one optical fiber endface (corresponding the first ferrule) toward that from the other optical fiber endface (corresponding the second ferrule), so that both endfaces may be imaged within the field of view of the inspection microscope.