Patents by Inventor Ratan Das

Ratan Das has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8451574
    Abstract: The present invention is directed to a method and a system for fault detection analysis in a power device which is operatively associated with a differential protection unit. The power device has one input side and one output side through which an input current and an output current flows into and out from it, respectively. Signals representative of the input and output currents are processed in order to verify if an occurring fault is external to the power device. Under a condition of an external fault, the differential protection unit is disabled for a determined interval of time.
    Type: Grant
    Filed: August 29, 2006
    Date of Patent: May 28, 2013
    Assignee: ABB Technology AG
    Inventors: Ratan Das, Sethuraman Ganesan, John M. Peterson
  • Publication number: 20100208403
    Abstract: The present invention is directed to a method and a system for fault detection analysis in a power device which is operatively associated with a differential protection unit. The power device has one input side and one output side through which an input current and an output current flows into and out from it, respectively. Signals representative of the input and output currents are processed in order to verify if an occurring fault is external to the power device. Under a condition of an external fault, the differential protection unit is disabled for a determined interval of time.
    Type: Application
    Filed: August 29, 2006
    Publication date: August 19, 2010
    Inventors: Ratan Das, Sethuraman Ganesan, John M. Peterson
  • Patent number: 7085659
    Abstract: A technique for dynamically determining the occurrence of a high impedance fault (HIF) independent of load. An HIF algorithm provides the energy value for a given number of samples of the input signal that is phase (load) currents and/or neutral (residual) current. The input signal energy value is multiplied by a factor that ranges from about 110% to about 300% to calculate a threshold energy value and the result of that calculation is stored in a buffer. A HIF detection signal is generated when the energy value determined for samples of the input signal that are the same in number as the given number of samples and taken after the given number of samples is greater than an energy value derived from a predetermined number of the calculated threshold energy values.
    Type: Grant
    Filed: October 15, 2004
    Date of Patent: August 1, 2006
    Assignee: ABB Technology AG
    Inventors: John Peterson, Ratan Das, Mohamed Y. Haj-Maharsi
  • Publication number: 20060085146
    Abstract: A technique for dynamically determining the occurrence of a high impedance fault (HIF) independent of load. An HIF algorithm provides the energy value for a given number of samples of the input signal that is phase (load) currents and/or neutral (residual) current. The input signal energy value is multiplied by a factor that ranges from about 110% to about 300% to calculate a threshold energy value and the result of that calculation is stored in a buffer. A HIF detection signal is generated when the energy value determined for samples of the input signal that are the same in number as the given number of samples and taken after the given number of samples is greater than an energy value derived from a predetermined number of the calculated threshold energy values.
    Type: Application
    Filed: October 15, 2004
    Publication date: April 20, 2006
    Inventors: John Peterson, Ratan Das, Mohamed Haj-Maharsi
  • Patent number: 6591203
    Abstract: An improved fault location method may be used to locate faults associated with one or more conductors of an electric power transmission and distribution system. The method includes the steps of detecting a fault; determining whether pre-fault data are available and, if so, using the pre-fault data to compute a load impedance and estimate the fault location using the computed load impedance; if pre-fault data are not available, determining whether pre-fault data are available in a first memory location and, if so, using the pre-fault data to compute a load impedance and estimate the fault location using the computed load impedance; and if pre-fault data are not available in the first memory location, using a pre-fault load impedance from a second memory location in estimating the fault location.
    Type: Grant
    Filed: April 26, 2000
    Date of Patent: July 8, 2003
    Assignee: ABB, Inc.
    Inventors: Ratan Das, Joseph P. Benco
  • Patent number: 6298309
    Abstract: A method for measuring a fundamental frequency of a power system comprises sampling voltage and current waveforms associated with the power system, wherein the voltage and current waveforms are characterized by a fundamental frequency component that may vary over time. Next, determine whether, according to a prescribed frequency tracking criterion, a present value of the fundamental frequency can be measured using voltage samples. If so, measure the fundamental frequency using the voltage samples, and set a best available value (“freq”) equal to the measured value based on voltage samples. If the fundamental frequency cannot be measured using the voltage samples, determine whether, according to the prescribed frequency tracking criterion, the present value of the fundamental frequency can be measured using current samples. If so, measure the fundamental frequency using the current samples and set the best available value equal to the measured value based on current samples.
    Type: Grant
    Filed: March 5, 1999
    Date of Patent: October 2, 2001
    Assignee: ABB Power T&D Company Inc.
    Inventors: Joseph Benco, Ratan Das, Cliff Downs