Abstract: A method and system for test vector selection in statistical volume diagnosis using failed test data is disclosed. A computer-implemented method receives failures representing defects detected by an integrated circuit testing apparatus from a plurality of integrated circuits. Each of the plurality of integrated circuits is tested with a set of test vectors generated by the integrated circuit testing apparatus, and each of the plurality of failures is associated with a failed test vector. Using a first ranking scheme, each of the failures is given a rank and the corresponding failed test vector in each of the plurality of integrated circuits is annotated with the rank. The annotated failed test vectors are grouped using a grouping scheme, and each of the groups is given a group rank. A first group of failed test vectors is selected based on the group rank and diagnostics is run on the first group of failed test vectors.

Abstract: A method and system for test vector selection in statistical volume diagnosis using failed test data is disclosed. A computer-implemented method receives failures representing defects detected by an integrated circuit testing apparatus from a plurality of integrated circuits. Each of the plurality of integrated circuits is tested with a set of test vectors generated by the integrated circuit testing apparatus, and each of the plurality of failures is associated with a failed test vector. Using a first ranking scheme, each of the failures is given a rank and the corresponding failed test vector in each of the plurality of integrated circuits is annotated with the rank. The annotated failed test vectors are grouped using a grouping scheme, and each of the groups is given a group rank. A first group of failed test vectors is selected based on the group rank and diagnostics is run on the first group of tailed test vectors.