Patents by Inventor Ratheesh Thekke Veetil

Ratheesh Thekke Veetil has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240003973
    Abstract: In one embodiment, a method includes: receiving, in a replica circuit associated with a first intellectual property (IP) circuit of a system on chip (SoC), a security policy; receiving, in the replica circuit, a test data register access message to identify an access to a first test data register of the first IP circuit; and preventing the access to the first test data register based at least in part on the security policy. Other embodiments are described and claimed.
    Type: Application
    Filed: June 29, 2022
    Publication date: January 4, 2024
    Inventors: Ratheesh Thekke Veetil, Gauri Shankar Singh
  • Patent number: 9836373
    Abstract: On-chip field testing methods and apparatus are disclosed. Example on-chip testers disclosed herein include a decoder having a test data input and a test stimuli interface. Disclosed example on-chip testers also include a multiplexer having a first multiplexer interface coupled to the test stimuli interface, a second multiplexer interface coupled to an automatic test equipment interface, a third multiplexer interface coupled to a design-for-testing subsystem interface and an interface selection input. Disclosed example on-chip testers further include a memory having a memory interface coupled to the test data input.
    Type: Grant
    Filed: February 24, 2015
    Date of Patent: December 5, 2017
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Srinivas Kumar Vooka, Vishwanath S, Pranav Murthy, Ratheesh Thekke Veetil, Rahul Gulati
  • Publication number: 20160146888
    Abstract: On-chip field testing methods and apparatus are disclosed. Example on-chip testers disclosed herein include a decoder having a test data input and a test stimuli interface. Disclosed example on-chip testers also include a multiplexer having a first multiplexer interface coupled to the test stimuli interface, a second multiplexer interface coupled to an automatic test equipment interface, a third multiplexer interface coupled to a design-for-testing subsystem interface and an interface selection input. Disclosed example on-chip testers further include a memory having a memory interface coupled to the test data input.
    Type: Application
    Filed: February 24, 2015
    Publication date: May 26, 2016
    Inventors: Srinivas Kumar Vooka, Vishwanath S, Pranav Murthy, Ratheesh Thekke Veetil, Rahul Gulati