Patents by Inventor Raun L. Goode

Raun L. Goode has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of testing a semiconductor device by automatically measuring probe tip parameters
    Patent number: 6127831
    Abstract: An integrated probe tip (20) parameter measuring device (70) is integrated onto the chuck (24) or substrate holder of a probe test station (10). Probe tip (20) force can be simultaneously measured for either a single probe tip, several probe, or all of the probe tips on a probe card (18). Integrating the measurement of probe tip (20) parameters such as probe tip force into a test station (10) yields real-time data about the probe process and allows feedback between measured probe tip parameters and probe chuck overdrive in the vertical direction. This integrated testing is done by periodically testing probe tip (20) parameters during the probing of die (26) on a wafer (22).
    Type: Grant
    Filed: April 21, 1997
    Date of Patent: October 3, 2000
    Assignee: Motorola, Inc.
    Inventors: Theodore Andrew Khoury, Raun L. Goode, Larry J. Bustos
  • Parallel roller tool for unloading semiconductor device sockets
    Patent number: 4589201
    Abstract: A parallel roller tool for quickly and carefully unloading groups of semiconductor devices from spring-biased semiconductor device sockets. The parallel roller tool has a plurality of roller support plates which support the rollers and may serve to align them with various socket rows. Use of this roller tool permits rapid unloading of trays containing semiconductor devices without overstressing the trays or touching the semiconductor devices with the tool.
    Type: Grant
    Filed: April 17, 1985
    Date of Patent: May 20, 1986
    Assignee: Motorola, Inc.
    Inventors: Carlos A. Kissinger, Raun L. Goode