Abstract: A method and system for manufacturing a circuit is disclosed.

Abstract: First data from a user device is received on an electronic computing device. The first data is encrypted to generate second data. The second data is fragmented and stored in a plurality of data stores.

Abstract: Systems, methods, and computer-readable media are disclosed for improved camera color calibration. An example method may involve capturing a first wavelength emitted by a first type of traffic light. The example method may also involve determining, based on the first wavelength, a first color value associated with the wavelength emitted by the first type of traffic light. The example method may also involve capturing, by a first camera, a first image, video, or real-time feed of a first portion of a test target, the first portion of the test target including a first light color that is based on the first color value. The example method may also involve determining, based on the first image, video, or real-time feed of the first portion of a test target, a second color value output by the camera. The example method may also involve determining, based on a comparison between the first color value and the second color value, that a difference exists between the first color value and the second color value.

Abstract: Systems, methods, and computer-readable media are disclosed for improved camera color calibration. An example method may involve capturing a first wavelength emitted by a first type of traffic light. The example method may also involve determining, based on the first wavelength, a first color value associated with the wavelength emitted by the first type of traffic light. The example method may also involve capturing, by a first camera, a first image, video, or real-time feed of a first portion of a test target, the first portion of the test target including a first light color that is based on the first color value. The example method may also involve determining, based on the first image, video, or real-time feed of the first portion of a test target, a second color value output by the camera. The example method may also involve determining, based on a comparison between the first color value and the second color value, that a difference exists between the first color value and the second color value.

Abstract: First data from a user device is received on an electronic computing device. The first data is encrypted to generate second data. The second data is fragmented and stored in a plurality of data stores.

Abstract: A phototherapy monitoring device (10) includes a housing (12) configured for attachment to a patient, and a user interfacing device. An optical bilimbin sensor (14) includes one or more light sources (16) operative to generate probe light and arranged on or in the housing such that the probe light is reflected from or transmitted through skin of the patient when the housing is attached to the patient; and one or more photodetectors (18) arranged on or in the housing to detect the probe light reflected from or transmitted through the skin of the patient. At least one electronic processor (28) is disposed on or in the housing and programmed to: continuously generate a current bilimbin level measurement from the detected probe light reflected from or transmitted through the skin of the patient; and control the user interfacing device to generate a notification when the current bilirubin level measurement satisfies a safe bilimbin level.

Abstract: A method and system for manufacturing a circuit is disclosed.

Abstract: A method includes: identifying a timing path of a logic circuit; determining a Boolean expression at an internal node in the timing path; providing a DC vector having a plurality of forms; determining a Boolean value at the internal node for each of the forms based on the Boolean expression; determining a quantity of stressed transistors in the timing path for each of the forms separately based on the respective Boolean value; and determining a best-case form, associated with an aging effect of the logic circuit, and a worst-case form, associated with the aging effect, out of the forms based on the quantities of stressed transistors.

Abstract: A method and system for manufacturing a circuit is disclosed.

Abstract: A method includes: identifying a timing path of a logic circuit; determining a Boolean expression at an internal node in the timing path; providing a DC vector having a plurality of forms; determining a Boolean value at the internal node for each of the forms based on the Boolean expression; determining a quantity of stressed transistors in the timing path for each of the forms separately based on the respective Boolean value; and determining a best-case form, associated with an aging effect of the logic circuit, and a worst-case form, associated with the aging effect, out of the forms based on the quantities of stressed transistors.

Abstract: The present invention relates to blood analysis. In order to determine the filling level of a cartridge, a device (10) is provided that comprises a cartridge interface (14) for receiving a cartridge and a liquid level sensor (16). A cartridge position guiding arrangement is configured to engage with the cartridge for providing a six degree-of-freedom constraint to the cartridge. The liquid level sensor comprises a light source (18) and a light detector (20). The light source is configured to provide a beam of light (22) incident upon a cavity surface (24) of an optical pit (26) of a cartridge received by the cartridge interface. The light detector is configured to detect a portion (28) of the beam of light reflected from the cavity surface of the optical pit. The device is configured to determine a filling level of the optical pit based on the detected portion of the beam of light.

Abstract: A method includes identifying a timing path in a transistor level from a graph diagram; calculating a plurality of aging costs associated with the timing path based on a plurality of forms of a DC vector; identifying a first form, associated with a first aging cost of the aging costs, from the forms; and identifying a second form, associated with a second aging cost less than the first aging cost, from the forms.

Abstract: A method for manufacturing an integrated circuit includes determining a static probability pattern of a circuit cell in a timing path of the integrated circuit; determining a timing delay of the circuit cell along the timing path according to the static probability pattern and a pattern based timing database, wherein the pattern based timing database indicates a plurality of reference delays of each timing arc of the circuit cell characterized in response to a plurality of input stress patterns respectively; and manufacturing the integrated circuit according to the timing delay of the circuit cell along the timing path.

Abstract: A method and system for manufacturing a circuit is disclosed.

Abstract: First data from a user device is received on an electronic computing device. The first data is encrypted to generate second data. The second data is fragmented and stored in a plurality of data stores.

Abstract: A method for manufacturing an integrated circuit includes determining a static probability pattern of a circuit cell in a timing path of the integrated circuit; determining a timing delay of the circuit cell along the timing path according to the static probability pattern and a pattern based timing database, wherein the pattern based timing database indicates a plurality of reference delays of each timing arc of the circuit cell characterized in response to a plurality of input stress patterns respectively; and manufacturing the integrated circuit according to the timing delay of the circuit cell along the timing path.

Abstract: A method includes generating a first timing library for a first set of circuit elements for a first set of input parameters. Generating the first timing library includes determining device characteristics for each of the circuit elements in the first set of circuit elements and storing the determined device characteristics in a database. A second timing library is generated for a second set of circuit elements for a second set of input parameters. The second timing library is generated by using one or more of the determined device characteristics previously stored in the database. A circuit is formed on a substrate. The circuit includes at least one of the first set of circuit elements or the second set of circuit elements.

Abstract: A method includes identifying a timing path in a transistor level from a graph diagram; calculating a plurality of aging costs associated with the timing path based on a plurality of forms of a DC vector; identifying a first form, associated with a first aging cost of the aging costs, from the forms; and identifying a second form, associated with a second aging cost less than the first aging cost, from the forms.

Abstract: A method includes generating a first timing library for a first set of circuit elements for a first set of input parameters. Generating the first timing library includes determining device characteristics for each of the circuit elements in the first set of circuit elements and storing the determined device characteristics in a database. A second timing library is generated for a second set of circuit elements for a second set of input parameters. The second timing library is generated by using one or more of the determined device characteristics previously stored in the database. A circuit is formed on a substrate. The circuit includes at least one of the first set of circuit elements or the second set of circuit elements.

Abstract: A system includes an analysis module and/or a prediction module. The analysis module receives data from a heat transfer device, and can compute a performance indicator indicative of an incipient anomaly condition of the heat transfer device based upon the received data, and/or can compute a normalized efficiency of the heat transfer device. The normalized efficiency represents a corrected efficiency that isolates effects of a process parameter on performance of the heat transfer device. The data represents a measurable process parameter or a change in a measurable process parameter in the heat transfer device. The prediction module receives the data and computes a performance indicator to predict performance degradation of the heat transfer device over time based upon the received data. Associated methods are provided.