Abstract: An apparatus and method for timing calibration of write and read-back data exchanges between respective dies of an external memory/external device has a master arbiter or, alternatively, a test bus between a system bus master interface and an external memory controller for driving the external memory/external device, a calibration circuit under control of the master arbiter via a test bus master interface to provide stepped-through time delays for test data exchanges between the dies, and the calibration circuit obtains pass/fail data indicating pass or fail of the varied time delays for the test data exchanges. A processor system at the system bus master interface selects calibration values corresponding to pass data, and applies the calibration values to the respective dies for timing of write and read-back data exchanges between the dies.

Abstract: An apparatus and method for timing calibration of write and read-back data exchanges between respective dies of an external memory/external device has a master arbiter or, alternatively, a test mux between a system bus master interface and an external memory controller for driving the external memory/external device, a calibration circuit under control of the master arbiter via a test bus master interface to provide stepped-through time delays for test data exchanges between the dies, and the calibration circuit obtains pass/fail data indicating pass or fail of the varied time delays for the test data exchanges. A processor system at the system bus master interface selects calibration values corresponding to pass data, and applies the calibration values to the respective dies for timing of write and read-back data exchanges between the dies.