Patents by Inventor Ravindranath Ramalingaiah MUNNAN

Ravindranath Ramalingaiah MUNNAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10593019
    Abstract: A method and apparatus for storing, processing and reconstructing full resolution image out of sub band encoded images are provided. The method of rendering high resolution images based on sub-band encoded data of an image includes steps of performing downscaling of a selected image, creating a time-stamped downscaled image, extracting sub-band information associated with the selected image at one instance in time, compressing the downscaled image and the sub-band information, and decompressing and adding the sub-band information with extrapolated downscaled image to reconstruct and render high resolution image.
    Type: Grant
    Filed: October 15, 2015
    Date of Patent: March 17, 2020
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Anurag Mithalal Jain, Ravindranath Ramalingaiah Munnan, Venkata Ravisankar Jayanthi, Rajat Agarwal, Ashish Ranjan, Joy Dutta, Yongman Lee, Sungoh Kim, Jae Hun Cho, Kwangyoung Kim, Hyunhee Park
  • Publication number: 20160110849
    Abstract: A method and apparatus for storing, processing and reconstructing full resolution image out of sub band encoded images are provided. The method of rendering high resolution images based on sub-band encoded data of an image includes steps of performing downscaling of a selected image, creating a time-stamped downscaled image, extracting sub-band information associated with the selected image at one instance in time, compressing the downscaled image and the sub-band information, and decompressing and adding the sub-band information with extrapolated downscaled image to reconstruct and render high resolution image.
    Type: Application
    Filed: October 15, 2015
    Publication date: April 21, 2016
    Inventors: Anurag Mithalal JAIN, Ravindranath Ramalingaiah MUNNAN, Venkata Ravisankar JAYANTHI, Rajat AGARWAL, Ashish RANJAN, Joy DUTTA, Yongman LEE, Sungoh KIM, Jae Hun CHO, Kwangyoung KIM, Hyunhee PARK
  • Patent number: 9077362
    Abstract: A chip with a built-in self-test (BIST) component capable of testing the linearity of an ADC is described herein. The BIST component uses hardware registers to facilitate a sliding histogram technique to save space on the chip. A subset of detected digital codes are analyzed, and DNL and INL calculations are performed by a controller to determine whether any of the digital codes in the subset exceed maximum or minimum DNL and INL thresholds. New digital codes being detected by the ADC are added to the subset as lower-value digital codes are pushed out of the subset, maintaining the same number of digital codes being analyzed as the subset moves from lower codes detected during lower voltages to higher codes detected at higher voltages. A synchronizer and pointer ensure that the subset moves through the digital codes at the same rate as the analog input ramp source.
    Type: Grant
    Filed: July 29, 2014
    Date of Patent: July 7, 2015
    Assignee: STMicroelectronics International N.V.
    Inventors: Ravindranath Ramalingaiah Munnan, Raghu Ravindran, Ravi Shekhar
  • Publication number: 20140333460
    Abstract: A chip with a built-in self-test (BIST) component capable of testing the linearity of an ADC is described herein. The BIST component uses hardware registers to facilitate a sliding histogram technique to save space on the chip. A subset of detected digital codes are analyzed, and DNL and INL calculations are performed by a controller to determine whether any of the digital codes in the subset exceed maximum or minimum DNL and INL thresholds. New digital codes being detected by the ADC are added to the subset as lower-value digital codes are pushed out of the subset, maintaining the same number of digital codes being analyzed as the subset moves from lower codes detected during lower voltages to higher codes detected at higher voltages. A synchronizer and pointer ensure that the subset moves through the digital codes at the same rate as the analog input ramp source.
    Type: Application
    Filed: July 29, 2014
    Publication date: November 13, 2014
    Applicant: STMicroelectronics International N.V.
    Inventors: Ravindranath Ramalingaiah Munnan, Raghu Ravindran, Ravi Shekhar
  • Patent number: 8803716
    Abstract: A chip with a built-in self-test (BIST) component capable of testing the linearity of an ADC is described herein. The BIST component uses hardware registers to facilitate a sliding histogram technique to save space on the chip. A subset of detected digital codes are analyzed, and DNL and INL calculations are performed by a controller to determine whether any of the digital codes in the subset exceed maximum or minimum DNL and INL thresholds. New digital codes being detected by the ADC are added to the subset as lower-value digital codes are pushed out of the subset, maintaining the same number of digital codes being analyzed as the subset moves from lower codes detected during lower voltages to higher codes detected at higher voltages. A synchronizer and pointer ensure that the subset moves through the digital codes at the same rate as the analog input ramp source.
    Type: Grant
    Filed: April 10, 2013
    Date of Patent: August 12, 2014
    Assignee: STMicroelectronics International N.V.
    Inventors: Ravindranath Ramalingaiah Munnan, Raghu Ravindran, Ravi Shekhar
  • Patent number: 8704952
    Abstract: A video decoder that separates and analyzes analog video signals includes a hue and saturation separator and a video signal determiner. The hue and saturation separator demodulates from a component video signal chroma signal, which includes a hue signal and a saturation signal. The video signal determiner determines at least one video signal characteristic of the component video signal dependent on the hue and saturation signal. The video signal determiner may include a mode determiner that determines the encoding standard of the video signal, and a color burst determiner that determines a location of a color burst signal with the video signal. The mode determiner may include a signal lock detector, a sequence matcher, and an encoding mode selector. The color burst determiner may include an absolute value determiner and a burst position determiner.
    Type: Grant
    Filed: September 30, 2011
    Date of Patent: April 22, 2014
    Assignee: STMicroelectronics International N.V.
    Inventor: Ravindranath Ramalingaiah Munnan
  • Publication number: 20130083247
    Abstract: A video decoder that separates and analyzes analog video signals includes a hue and saturation separator and a video signal determiner. The hue and saturation separator demodulates from a component video signal chroma signal, which includes a hue signal and a saturation signal. The video signal determiner determines at least one video signal characteristic of the component video signal dependent on the hue and saturation signal. The video signal determiner may include a mode determiner that determines the encoding standard of the video signal, and a color burst determiner that determines a location of a color burst signal with the video signal. The mode determiner may include a signal lock detector, a sequence matcher, and an encoding mode selector. The color burst determiner may include an absolute value determiner and a burst position determiner.
    Type: Application
    Filed: September 30, 2011
    Publication date: April 4, 2013
    Applicant: STMicroelectronics Pvt Ltd.
    Inventor: Ravindranath Ramalingaiah MUNNAN