Patents by Inventor Ray Ellis

Ray Ellis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8017424
    Abstract: An apparatus for measuring the relative positions of frontside and backside alignment marks located on opposite sides of a substrate is disclosed. The apparatus includes upper and lower optical systems that allow for simultaneous imaging of frontside and backside alignment marks. The frontside and backside alignment mark images are processed to determine the relative position of the marks, as a measurement of the alignment and/or overlay performance of the tool that formed the marks on the substrate.
    Type: Grant
    Filed: November 11, 2010
    Date of Patent: September 13, 2011
    Assignee: Ultratech, Inc.
    Inventors: Albert J Crespin, Jim Woodruff, Ray Ellis, Scott Kulas, Joe Jamello, Emily True
  • Publication number: 20110058731
    Abstract: An apparatus for measuring the relative positions of frontside and backside alignment marks located on opposite sides of a substrate is disclosed. The apparatus includes upper and lower optical systems that allow for simultaneous imaging of frontside and backside alignment marks. The frontside and backside alignment mark images are processed to determine the relative position of the marks, as a measurement of the alignment and/or overlay performance of the tool that formed the marks on the substrate.
    Type: Application
    Filed: November 11, 2010
    Publication date: March 10, 2011
    Applicant: Ultratech, Inc.
    Inventors: Albert J. Crespin, Jim Woodruff, Ray Ellis, Scott Kulas, Joe Jamello, Emily True
  • Patent number: 7902040
    Abstract: An apparatus for measuring the relative positions of frontside and backside alignment marks located on opposite sides of a substrate is disclosed. The apparatus includes upper and lower optical systems that allow for simultaneous imaging of frontside and backside alignment marks. The frontside and backside alignment mark images are processed to determine the relative position of the marks, as a measurement of the alignment and/or overlay performance of the tool that formed the marks on the substrate.
    Type: Grant
    Filed: October 2, 2008
    Date of Patent: March 8, 2011
    Assignee: Ultratech, Inc.
    Inventors: Albert J. Crespin, Jim Woodruff, Ray Ellis, Scott Kulas, Joe Jamello, Emily True
  • Patent number: 7873428
    Abstract: A method and apparatus are disclosed for improving the implementation of automated job management for equipment in a factory. A software library is provided that allows a job management client, such as a thin station controller client, to communicate with an equipment server, such as an equipment interface bridge (EIB). The job management client can create, control and monitor jobs conveniently and efficiently utilizing industry standard protocols. The equipment server communicates directly in real-time with factory equipment. By providing an interface between a job management client and an equipment server, data consumer clients are effectively decoupled from job management clients, allowing next generation station controllers for monitoring and controlling equipment processing to be easily implemented. Layers of expensive and complex code currently in use for job management can be replaced with a superior and cost-effective thin-client, distributed architecture.
    Type: Grant
    Filed: April 15, 2005
    Date of Patent: January 18, 2011
    Assignee: PEER Intellectual Property, Inc.
    Inventors: Ray Ellis, Evzen Wagner
  • Patent number: 7751067
    Abstract: Methods and apparatuses are provided for positioning a substrate having a target that may be located on either the front-side or the backside of the substrate. The optical detector that views the target contains a signal-generating material that is substantially identical to the substrate material.
    Type: Grant
    Filed: May 24, 2007
    Date of Patent: July 6, 2010
    Assignee: Ultratech, Inc.
    Inventors: Emily True, Ray Ellis, Shiyu Zhang
  • Patent number: 7528937
    Abstract: An apparatus for measuring the relative positions of frontside and backside alignment marks located on opposite sides of a substrate is disclosed. The apparatus includes upper and lower optical systems that allow for simultaneous imaging of frontside and backside alignment marks. The frontside and backside alignment mark images are processed to determine the relative position of the marks, as a measurement of the alignment and/or overlay performance of the tool that formed the marks on the substrate.
    Type: Grant
    Filed: August 5, 2002
    Date of Patent: May 5, 2009
    Assignee: Ultratech, Inc.
    Inventors: Albert J. Crespin, Jim Woodruff, Ray Ellis, Scott Kulas, Joe Jamello, Emily True
  • Publication number: 20060235554
    Abstract: A method and apparatus are disclosed for improving the implementation of automated job management for equipment in a factory. A software library is provided that allows a job management client, such as a thin station controller client, to communicate with an equipment server, such as an equipment interface bridge (EIB). The job management client can create, control and monitor jobs conveniently and efficiently utilizing industry standard protocols. The equipment server communicates directly in real-time with factory equipment. By providing an interface between a job management client and an equipment server, data consumer clients are effectively decoupled from job management clients, allowing next generation station controllers for monitoring and controlling equipment processing to be easily implemented. Layers of expensive and complex code currently in use for job management can be replaced with a superior and cost-effective thin-client, distributed architecture.
    Type: Application
    Filed: April 15, 2005
    Publication date: October 19, 2006
    Inventors: Ray Ellis, Evzen Wagner
  • Patent number: 4849673
    Abstract: The present invention concerns an electroluminescent panel suitable for unidirectional and/alternating voltage order, a transparent glass substrate (10), a thin transparent front electrode film (12) made of indium-tin-oxide, a first thin (preferably 1-2 microns thick) layer (14) of a phosphor in the form of powder particles, the surface of the particles being free of any metallic coating, e.g. Cu coating, an electrically conducting, dark powder layer (16) which is a control layer consisting e.g. of MnO.sub.2 uncoated or undoped with Cu and a (preferably aluminium) back electrode layer )18).
    Type: Grant
    Filed: July 15, 1988
    Date of Patent: July 18, 1989
    Assignee: Phosphor Products Company Limited
    Inventors: Norman J. Werring, Ray Ellis, Malcolm H. Higton
  • Patent number: RE44116
    Abstract: Methods and apparatuses are provided for positioning a substrate having a target that may be located on either the front-side or the backside of the substrate. The optical detector that views the target contains a signal-generating material that is substantially identical to the substrate material.
    Type: Grant
    Filed: February 3, 2012
    Date of Patent: April 2, 2013
    Assignee: Ultratech, Inc.
    Inventors: Emily True, Ray Ellis, Shiyu Zhang