Patents by Inventor Raymond Dean Eppich

Raymond Dean Eppich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for characterizing dielectric loss tangent
    Patent number: 8354833
    Abstract: A method for characterizing dielectric loss tangent of a dielectric material. The method includes: introducing an incident wave in a mismatched transmission line; measuring a first insertion loss from a first resulting standing wave, at a given frequency; augmenting the mismatched transmission line with the dielectric material; introducing the incident wave in the transmission line augmented with the dielectric material; measuring a second insertion loss from a second resulting standing wave, at the given frequency; and calculating the dielectric loss tangent based on the differences between the first and second measured insertion losses.
    Type: Grant
    Filed: March 30, 2010
    Date of Patent: January 15, 2013
    Assignee: Raytheon Company
    Inventor: Raymond Dean Eppich
  • METHOD FOR CHARACTERIZING DIELECTRIC LOSS TANGENT
    Publication number: 20110241710
    Abstract: A method for characterizing dielectric loss tangent of a dielectric material. The method includes: introducing an incident wave in a mismatched transmission line; measuring a first insertion loss from a first resulting standing wave, at a given frequency; augmenting the mismatched transmission line with the dielectric material; introducing the incident wave in the transmission line augmented with the dielectric material; measuring a second insertion loss from a second resulting standing wave, at the given frequency; and calculating the dielectric loss tangent based on the differences between the first and second measured insertion losses.
    Type: Application
    Filed: March 30, 2010
    Publication date: October 6, 2011
    Inventor: Raymond Dean Eppich