Abstract: A test adapter is provided for connection to a PLCC (Plastic Leaded Clip Carrier), hereinafter referred to as a carrier, which assures accurate alignment with the carrier, which can be locked to the carrier during a test, which has a width only slightly greater than that of the carrier to enable testing of closely mounted carriers, and which can be simply constructed. The adapter includes an inner housing that bears against the top of the carrier and four contact frames pivotally mounted on the housing and carrying contacts that engage leads of the carrier. Each contact frame has separators between the contacts, the separators passing between the leads of the carrier to directly engage the sides of the carrier housing. The lower surface portions of the separators are slightly angled from the vertical so when they press against angled surfaces on the carrier housing sides, the adapter is locked to the carrier.

Abstract: An adapter is described for making connection between the contact pads of a LCC (Leadless Chip Carrier) and the terminals of an ordinary low-cost socket that normally receives the LCC and connects it to a printed circuit board, while also providing connections for test equipment to monitor the interface between the LCC and the printed circuit, or just the LCC, or just the printed circuit. The adapter includes a base element which fits into the socket and which has multiple pads that contact the terminals of the socket, and a test interfacer which attaches to the base element and extends upwardly therefrom. The interfacer has a receiver for receiving a LCC and has leads that extend between the pads of the LCC and the pads of the base element. The leads also have portions that are accessible from the outside so that test equipment can be connected to them to monitor the interface between the LCC and the socket which connects to the printed circuit board.

Abstract: A test adapter for a chip carrier having leads along the four side edges thereof. The adapter comprises an inner housing having latches on its corners which engage the undersides of the corners of the carrier body to retain the adapter thereon. The adapter also includes an outer housing on which the test contacts are mounted. The outer housing is pushed downwardly to cause the contacts to engage the carrier chip leads with a positive wiping action.