Abstract: The present invention is directed to a contact resistance test structure and methods of using same. In one illustrative embodiment, the method includes forming a test structure comprised of two gate electrode structures, forming a plurality of conductive contacts to a doped region between the two gate electrode structures, forcing a current through the test structure and determining a resistance of at least one of the conductive contacts based upon, in part, the forced current.

Abstract: A data link (1000) multiplexes a large number of concurrently operating channel onto a single pair of fiber-optic cables (10 and 1010). A receiver (1004A) at one end of the links determines whether it is in sychronism with the signals that it receives over one of the cables (1010), and a transmitter (1002A) includes the result of that determination with the data that it sends to the other end if the link so that devices at the other end of the link can be caused to log off in response to extended lapses in synchronism at the first end. Each transmitter also sends an error count to the other end, and is responsive to a mode signal from the other end to reduce its signal power, so that maintenance personnel can perform many testing and diagnostic procedures from a single end of the link.