Abstract: A method of forming a waveguide, the method comprising the steps of: forming a multilayer stack of light guiding layers; and delaminating the multilayer stack between at least two of the light guiding layers to form a waveguide between the light guiding layers; in which the patterned region has converging sides and the waveguide is tapered, the multilayer stack having increased transmissivity at a region corresponding to a selected thickness of the waveguide. A tapered waveguide is also disclosed, comprising: a multilayer stack of light guiding layers; the multilayer stack defining a channel between at least a first waveguiding layer and a second waveguiding layer; the channel having a diminishing thickness in a first direction; and at least one of the first waveguiding layer and the second waveguiding layer having a region of increased transmissivity adjacent a selected thickness of the core. Methods for the use of the tapered waveguide as an optical coupler or spectrometer are also disclosed.

Abstract: A method of forming a waveguide is disclosed, as well as the waveguide itself. A multilayer stack of light guiding layers is formed, and the multilayer stack is delaminated between light guiding layers to form a waveguide between the light guiding layers. The multilayer stack is delaminated in a patterned region between light guiding layers. Here a new approach is described, wherein hollow microchannels forming a Bragg waveguide assembly are fabricated by controlled formation of thin film delamination buckles within a multilayer stack. A hollow waveguide is formed by alternating layers of the multilayer stack forming light guiding surfaces. The hollow waveguide is formed between layers that delaminate from each other, as for example under applied stress to one or more of the layers. The multi-layer stack may be formed of alternating layers of low and high index of refraction materials, as for example forming omni-directional dielectric reflectors.

Abstract: A thin film transistor (TFT) array having test circuitry includes a thin film transistor array body having a plurality of pixels. Test circuitry is integrally formed with the body. The test circuitry includes a power supply for supplying power via the test circuitry to the body; and a plurality of wireless switches to activate selected pixels.

Abstract: A method of forming a waveguide, the method comprising the steps of: forming a multilayer stack of light guiding layers; and delaminating the multilayer stack between at least two of the light guiding layers to form a waveguide between the light guiding layers; in which the patterned region has converging sides and the waveguide is tapered, the multilayer stack having increased transmissivity at a region corresponding to a selected thickness of the waveguide. A tapered waveguide is also disclosed, comprising: a multilayer stack of light guiding layers; the multilayer stack defining a channel between at least a first waveguiding layer and a second waveguiding layer; the channel having a diminishing thickness in a first direction; and at least one of the first waveguiding layer and the second waveguiding layer having a region of increased transmissivity adjacent a selected thickness of the core. Methods for the use of the tapered waveguide as an optical coupler or spectrometer are also disclosed.

Abstract: A method of forming a waveguide is disclosed, as well as the waveguide itself. A multilayer stack of light guiding layers is formed, and the multilayer stack is delaminated between light guiding layers to form a waveguide between the light guiding layers. The multilayer stack is delaminated in a patterned region between light guiding layers. Here a new approach is described, wherein hollow microchannels forming a Bragg waveguide assembly are fabricated by controlled formation of thin film delamination buckles within a multilayer stack. A hollow waveguide is formed by alternating layers of the multilayer stack forming light guiding surfaces. The hollow waveguide is formed between layers that delaminate from each other, as for example under applied stress to one or more of the layers. The multi-layer stack may be formed of alternating layers of low and high index of refraction materials, as for example forming omni-directional dielectric reflectors.

Abstract: A thin film transistor (TFT) array having test circuitry includes a thin film transistor array body having a plurality of pixels. Test circuitry is integrally formed with the body. The test circuitry includes a power supply for supplying power via the test circuitry to the body; and a plurality of wireless switches to activate selected pixels.