Patents by Inventor Raymond W. Schmitt

Raymond W. Schmitt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Submersible N-wavelength interrogation system and method for multiple wavelength interferometers
    Patent number: 10078050
    Abstract: In an in situ interrogation system for multiple wavelength interferometers a fringe spectrum that includes non-quadrature-spaced radiation-intensity samples is analyzed to obtain a high resolution relative phase measurement of the optical path length difference associated with the fringe spectrum. The fringe spectrum can be analyzed to obtain a fringe number and a quadrant as well, which can be combined with the relative phase measurement to obtain a high precision measurement of the absolute optical path length difference. An environmental condition corresponding to the absolute optical path length difference can be measured using the measurement of the absolute optical path length difference including salinity, pressure, density, and refractive index of a medium.
    Type: Grant
    Filed: August 3, 2016
    Date of Patent: September 18, 2018
    Assignee: Woods Hole Oceanographic Institution
    Inventors: Jason A. Kapit, Raymond W. Schmitt, Norman E. Farr
  • SUBMERSIBLE N-WAVELENGTH INTERROGATION SYSTEM AND METHOD FOR MULTIPLE WAVELENGTH INTERFEROMETERS
    Publication number: 20170030830
    Abstract: In an in situ interrogation system for multiple wavelength interferometers a fringe spectrum that includes non-quadrature-spaced radiation-intensity samples is analyzed to obtain a high resolution relative phase measurement of the optical path length difference associated with the fringe spectrum. The fringe spectrum can be analyzed to obtain a fringe number and a quadrant as well, which can be combined with the relative phase measurement to obtain a high precision measurement of the absolute optical path length difference. An environmental condition corresponding to the absolute optical path length difference can be measured using the measurement of the absolute optical path length difference including salinity, pressure, density, and refractive index of a medium.
    Type: Application
    Filed: August 3, 2016
    Publication date: February 2, 2017
    Inventors: Jason A. Kapit, Raymond W. Schmitt, Norman E. Farr
  • N-wavelength interrogation system and method for multiple wavelength interferometers
    Patent number: 9441947
    Abstract: In an interrogation system for multiple wavelength interferometers a fringe spectrum that includes non-quadrature-spaced radiation-intensity samples is analyzed to obtain a high resolution relative phase measurement of the optical path-length difference associated with the fringe spectrum. The fringe spectrum can be analyzed to obtain a fringe number and a quadrant as well, which can be combined with the relative phase measurement to obtain a high precision measurement of the absolute optical path-length difference. An environmental condition corresponding to the absolute optical path-length difference can be measured using the measurement of the absolute optical path-length difference.
    Type: Grant
    Filed: January 28, 2014
    Date of Patent: September 13, 2016
    Assignee: Woods Hole Oceanographic Institution
    Inventors: Jason A. Kapit, Norman E. Farr, Raymond W. Schmitt
  • N-WAVELENGTH INTERROGATION SYSTEM AND METHOD FOR MULTIPLE WAVELENGTH INTERFEROMETERS
    Publication number: 20140293286
    Abstract: In an interrogation system for multiple wavelength interferometers a fringe spectrum that includes non-quadrature-spaced radiation-intensity samples is analyzed to obtain a high resolution relative phase measurement of the optical path-length difference associated with the fringe spectrum. The fringe spectrum can be analyzed to obtain a fringe number and a quadrant as well, which can be combined with the relative phase measurement to obtain a high precision measurement of the absolute optical path-length difference. An environmental condition corresponding to the absolute optical path-length difference can be measured using the measurement of the absolute optical path-length difference.
    Type: Application
    Filed: January 28, 2014
    Publication date: October 2, 2014
    Inventors: Jason A. Kapit, Norman E. Farr, Raymond W. Schmitt