Abstract: Efficient and effective testing systems and methods are presented. In one embodiment, a system includes: a user interface configured to enable user interaction with the system; a test board configured to communicatively couple with a plurality of devices under test (DUTs), wherein the DUTs are compute express link (CXL) protocol compliant; and a tester configured to direct testing of the plurality of DUTs, wherein the tester is configured to enable hot add of one of the plurality of DUTs without interfering with testing of the other DUTS. In one exemplary implementation, the DUTs are memory devices and the DUTs can operate as extended memory. The user interface can be utilized to indicate a pause to remove a DUT and to indicate a DUT has been added and to trigger a re-start. The added one of the plurality of DUTs can be automatically recognized by a host in a way that is transparent to users. The tester automatically directs the hot add in response to a user trigger.