Patents by Inventor Reed Wilburn Adams

Reed Wilburn Adams has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Current mirror with circuitry that allows for over voltage stress testing
    Patent number: 7439796
    Abstract: A current mirror circuit that allows for over voltage stress testing includes: a first transistor; a second transistor having a gate coupled to a gate of the first transistor; a switch coupled between the gate of the first transistor and the drain of the first transistor; a bias source coupled to a control node of the switch such that the switch is ON during normal current mirror operation, and the switch is OFF during over voltage stress testing; and a clamp coupled between the control node of the switch and a source node.
    Type: Grant
    Filed: June 5, 2006
    Date of Patent: October 21, 2008
    Assignee: Texas Instruments Incorporated
    Inventors: Amer Hani Atrash, Reed Wilburn Adams
  • A Current Mirror with Circuitry That Allows for Over Voltage Stress Testing
    Publication number: 20080122475
    Abstract: A current mirror circuit that allows for over voltage stress testing includes: a first transistor; a second transistor having a gate coupled to a gate of the first transistor; a switch coupled between the gate of the first transistor and the drain of the first transistor; a bias source coupled to a control node of the switch such that the switch is ON during normal current mirror operation, and the switch is OFF during over voltage stress testing; and a clamp coupled between the control node of the switch and a source node.
    Type: Application
    Filed: June 5, 2006
    Publication date: May 29, 2008
    Applicant: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Amer Hani Atrash, Reed Wilburn Adams