Patents by Inventor Reena Meijer Drees
Reena Meijer Drees has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9612213Abstract: Nuclear-based basis weight sensors are passline-sensitive. Error in measurement is induced when the sheet moves up and down in the gap between the radiation source and detector. A passline-insensitive basis weight sensor includes a triangulation sensor to measure the position of the sheet within the gap. The sensor and gap is characterized in the laboratory for its passline behavior over a range of basis weights. The curves are either parameterized or a lookup table is created for each weight and passline position and the data added to the sensor's processor. The basis weight measured can be automatically corrected to account for deviations from the passline or nominal path through the sensor.Type: GrantFiled: October 17, 2014Date of Patent: April 4, 2017Assignee: Honeywell ASCa Inc.Inventors: Reena Meijer Drees, Gertjan Hofman
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Publication number: 20150323375Abstract: Nuclear-based basis weight sensors are passline-sensitive. Error in measurement is induced when the sheet moves up and down in the gap between the radiation source and detector. A passline-insensitive basis weight sensor includes a triangulation sensor to measure the position of the sheet within the gap. The sensor and gap is characterized in the laboratory for its passline behavior over a range of basis weights. The curves are either parameterized or a lookup table is created for each weight and passline position and the data added to the sensor's processor. The basis weight measured can be automatically corrected to account for deviations from the passline or nominal path through the sensor.Type: ApplicationFiled: October 17, 2014Publication date: November 12, 2015Applicant: Honeywell ASCa Inc.Inventors: Reena Meijer Drees, Gertjan Hofman
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Patent number: 8464572Abstract: A system includes a signal source that provides a first signal for measuring a gas content of a liquid sample. The system also includes an analyzer that determines the gas content of the liquid sample using a measurement of a second signal, where the second signal is based on the first signal. The system further includes an apparatus with a walled structure having a cavity. The apparatus also includes a piston that pulls the liquid sample into the cavity and pushes the liquid sample out of the cavity. The apparatus further includes at least one measurement window having at least one inner surface exposed within the cavity. The at least one measurement window receives the first signal from the signal source and provides the second signal to the analyzer. The piston could also clean the at least one inner surface, and the piston can include a reference material for calibrating the analyzer.Type: GrantFiled: October 7, 2010Date of Patent: June 18, 2013Assignee: Honeywell ASCA Inc.Inventors: Adam Krolak, Reena Meijer Drees, Frank M. Haran, Sebastien Tixier
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Patent number: 8394449Abstract: An improved differential coat weight technique employs a novel algorithm for measuring the weight of a coating material that has been deposited onto a sheet of substrate. The invention employs dual x-ray or nuclear gauges such that, even though the downstream sensor is never exposed to uncoated sheet substrate, imparting the downstream sensor with the ability to predict results that it would have yielded when measuring the uncoated sheet substrate, leads to the development of a coat weight calibration protocol from which the basis weight of the coating can be ascertained directly from measurements from the upstream and downstream sensors. No subtraction of results is required. Moreover, the two sensors do not need to be re-calibrated whenever the relative proportions of the coating and base substrate change. The technique is particularly suited for applications where the coating material and substrate are made of substances that have very different atomic numbers.Type: GrantFiled: November 19, 2009Date of Patent: March 12, 2013Assignee: Honeywell ASCa Inc.Inventors: Reena Meijer Drees, Gertjan Hofman
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Publication number: 20120085144Abstract: A system includes a signal source that provides a first signal for measuring a gas content of a liquid sample. The system also includes an analyzer that determines the gas content of the liquid sample using a measurement of a second signal, where the second signal is based on the first signal. The system further includes an apparatus with a walled structure having a cavity. The apparatus also includes a piston that pulls the liquid sample into the cavity and pushes the liquid sample out of the cavity. The apparatus further includes at least one measurement window having at least one inner surface exposed within the cavity. The at least one measurement window receives the first signal from the signal source and provides the second signal to the analyzer. The piston could also clean the at least one inner surface, and the piston can include a reference material for calibrating the analyzer.Type: ApplicationFiled: October 7, 2010Publication date: April 12, 2012Applicant: Honeywell ASCa Inc.Inventors: Adam Krolak, Reena Meijer Drees, Frank M. Haran, Sebastien Tixier
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Patent number: 7868296Abstract: A spectroscopic method and spectroscopy system therefrom for analyzing samples. A sample includes a first chemical component that has a characteristic first absorption peak is provided. The sample is irradiated in a measurement waveband proximate to the first absorption peak, and at a first and a second reference waveband where the first chemical component lacks characteristic absorption features. Reflected or transmitted detection data is obtained including a measured power proximate to the first absorption peak and first and second reference powers at the reference wavebands. A plurality of different waveband ratios are evaluated using pairs of detection data to generate a plurality of measured waveband ratio values.Type: GrantFiled: March 30, 2009Date of Patent: January 11, 2011Assignee: Honeywell ASCA Inc.Inventors: Frank M. Haran, Reena Meijer-Drees, Sebastien Tixier
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Publication number: 20100243900Abstract: A spectroscopic method and spectroscopy system therefrom for analyzing samples. A sample includes a first chemical component that has a characteristic first absorption peak is provided. The sample is irradiated in a measurement waveband proximate to the first absorption peak, and at a first and a second reference waveband where the first chemical component lacks characteristic absorption features. Reflected or transmitted detection data is obtained including a measured power proximate to the first absorption peak and first and second reference powers at the reference wavebands. A plurality of different waveband ratios are evaluated using pairs of detection data to generate a plurality of measured waveband ratio values.Type: ApplicationFiled: March 30, 2009Publication date: September 30, 2010Applicant: HONEYWELL ASCA INC.Inventors: Frank M. HARAN, Reena Meijer DREES, Sebastien TIXIER
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Publication number: 20100159121Abstract: An improved differential coat weight technique employs a novel algorithm for measuring the weight of a coating material that has been deposited onto a sheet of substrate. The invention employs dual x-ray or nuclear gauges such that, even though the downstream sensor is never exposed to uncoated sheet substrate, imparting the downstream sensor with the ability to predict results that it would have yielded when measuring the uncoated sheet substrate, leads to the development of a coat weight calibration protocol from which the basis weight of the coating can be ascertained directly from measurements from the upstream and downstream sensors. No subtraction of results is required. Moreover, the two sensors do not need to be re-calibrated whenever the relative proportions of the coating and base substrate change. The technique is particularly suited for applications where the coating material and substrate are made of substances that have very different atomic numbers.Type: ApplicationFiled: November 19, 2009Publication date: June 24, 2010Applicant: Honeywell ASCa Inc.Inventors: Reena Meijer Drees, Gertjan Hofman
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Patent number: 7399971Abstract: An apparatus, method and computer program product for determining a concentration of a high-Z material in a material sample. The method comprises steps of: receiving a material sample and subjecting the material sample to a first sensor device that is substantially ash insensitive for generating a first sensor response signal, and a second sensor device that is sensitive to presence of high-Z material and generating a second sensor response signal. Both the first and second sensor response signals from the first and second sensor devices are processed simultaneously to extract a weight of the high-Z material additive. The weight of the high-Z material additive is determined in a single scan of the material sample.Type: GrantFiled: December 23, 2005Date of Patent: July 15, 2008Assignee: Honeywell International Inc.Inventors: Gertjan J. Hofman, Reena Meijer Drees