Patents by Inventor Reid Allen Wistort

Reid Allen Wistort has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Enhanced built-in self-test circuit and method
    Patent number: 5918003
    Abstract: An Array Built-In Self Test (ABIST) circuit places on-chip circuits such as memory arrays in a known state, then stops. In the alternative, the ABIST circuit may initialize to a particular subcycle within a pattern sequence, and repeatedly loop on the subcycle, or repeatedly loop on the entire pattern sequence.
    Type: Grant
    Filed: February 14, 1997
    Date of Patent: June 29, 1999
    Assignee: International Business Machines Corporation
    Inventors: Garrett Stephen Koch, Michael Richard Ouellette, Reid Allen Wistort