Abstract: Methods and systems for estimating cost for device testing are disclosed. In one embodiment, the method comprises reading a test file having a plurality of test vectors, determining a required memory needed to execute the plurality of test vectors, and using the required memory to estimate a cost to execute the test vectors.

Abstract: In one embodiment, a method of has the steps of A) accessing a stream of test data comprising 1) a number of state events and 2) a number of data events interspersed with the ones of the state events; B) upon accessing one of the data events, determining if the data event is in conformity with the current test state; C) if not, 1) buffering a number of additional data events; and 2) if the number of additional data events imply that a state event should have been received and a state change should have occurred, prior to accessing the data event, i) synthesizing and publishing the state event that should have been received, in conformity with the implied state change; ii) updating the current test state; and iii) then, publishing the data event.