Patents by Inventor Reid Riedlinger

Reid Riedlinger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9075614
    Abstract: A processor may include a core and an uncore area. The power consumed by the core area may be controlled by controlling the Cdyn of the processor such that the Cdyn is within an allowable Cdyn value irrespective of the application being processed by the core area. The power management technique includes measuring digital activity factor (DAF), monitoring architectural and data activity levels, and controlling power consumption by throttling the instructions based on the activity levels. As a result of throttling the instructions, throttling may be implemented in 3rd droop and thermal design point (TDP). Also, the idle power consumed by the uncore area while the core area is in deep power saving states may be reduced by varying the reference voltage VR and the VP provided to the uncore area. As a result, the idle power consumed by the uncore area may be reduced.
    Type: Grant
    Filed: March 1, 2013
    Date of Patent: July 7, 2015
    Assignee: Intel Corporation
    Inventors: Eric Fetzer, Reid Riedlinger, Don Soltis, William Bowhill, Satish Shrimali, Krishnakanth Sistla, Efraim Rotem, Rakesh Kumar, Vivek Garg, Alon Naveh, Lokesh Sharma
  • Publication number: 20130232368
    Abstract: A processor may include a core and an uncore area. The power consumed by the core area may be controlled by controlling the Cdyn of the processor such that the Cdyn is within an allowable Cdyn value irrespective of the application being processed by the core area. The power management technique includes measuring digital activity factor (DAF), monitoring architectural and data activity levels, and controlling power consumption by throttling the instructions based on the activity levels. As a result of throttling the instructions, throttling may be implemented in 3rd droop and thermal design point (TDP). Also, the idle power consumed by the uncore area while the core area is in deep power saving states may be reduced by varying the reference voltage VR and the VP provided to the uncore area. As a result, the idle power consumed by the uncore area may be reduced.
    Type: Application
    Filed: March 1, 2013
    Publication date: September 5, 2013
    Inventors: ERIC FETZER, REID RIEDLINGER, DON SOLTIS, WILLIAM BOWHILL, SATISH SHRIMALI, KRISHNAKANTH SISTLA, EFRAIM ROTEM, RAKESH KUMAR, VIVEK GARG, ALON NAVEH, LOKESH SHARMA
  • Publication number: 20060290365
    Abstract: A processor comprises a chip, a temperature sensing device, a processor core, and a controller. The temperature sensing device, the processor core, and the controller are integrated on the chip. The controller is configured to set, based on the temperature sensing device, the processor core to a plurality of specified operating points to enable testing of the specified operating points. Each of the operating points is defined by a different temperature and frequency combination, and the processor core is configured to run a set of test codes at each of the operating points.
    Type: Application
    Filed: June 23, 2005
    Publication date: December 28, 2006
    Inventors: Reid Riedlinger, Douglas Cutter
  • Publication number: 20060055428
    Abstract: One disclosed embodiment may comprise a design method for a dynamic circuit system. The method may include providing a design for a single stage network comprising a pull-down network that is configured to perform a desired logic function according to a plurality of inputs. The method may also include designing a multi-stage network that includes at least two stages, each of the at least two stages including a pull-down network that receives a respective portion of the plurality of inputs and each of the at least two stages cooperating to perform the desired logic function.
    Type: Application
    Filed: September 14, 2004
    Publication date: March 16, 2006
    Inventors: Steven Affleck, Reid Riedlinger, Douglas Stirrett
  • Publication number: 20050078543
    Abstract: In a preferred embodiment, the invention provides a circuit and method for improving the soft error rate in a dual-port read SRAM cell. A write-only transfer device is connected to a cross-coupled latch, a first wordline, and a first bitline. A first read-only transfer device is connected to a second bitline, a second wordline, and a first pull-down device. A second read-only transfer device is connected to the first bitline, the first wordline, and a second pull-down device. A clear memory transfer device is connected to the cross-coupled latch, a third bitline, and a third pull-down device. This configuration allows a reduction in the size of a dual-port SRAM cell with little or no reduction in the read access time of the cell. The reduction in size also reduces SER by reducing the cross-sectional, p/n junction area exposed to radiation.
    Type: Application
    Filed: October 10, 2003
    Publication date: April 14, 2005
    Inventors: Reid Riedlinger, Brandon Yelton, Steven Affleck
  • Publication number: 20050066115
    Abstract: Systems and methods are provided for searching at least one content addressable memory entry associated with a content addressable memory (CAM). A given content addressable memory entry comprises a plurality of CAM fields. At least one input selector controls access to the plurality of CAM fields, such that retrieval of a subset of the plurality of CAM fields is selectively enabled. A match evaluator compares an enabled subset of CAM fields to a search value.
    Type: Application
    Filed: September 24, 2003
    Publication date: March 24, 2005
    Inventors: Kuldeep Simha, Reid Riedlinger