Patents by Inventor Reiko OKAYAMA

Reiko OKAYAMA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10822718
    Abstract: A method for producing an AlN single crystal substrate, the method including: i) preparing a first base substrate consisting of a first AlN single crystal; ii) growing a first AlN single crystal layer over a main face of the first base substrate, to obtain a layered body; iii) cutting the first MN single crystal layer of the layered body, to separate the layered body into a second base substrate and a first part of the first AlN single crystal layer, the second base substrate including the first base substrate and a thin film layered thereon, the thin film being a second part of the first AlN single crystal layer; iv) polishing a surface of the thin film, to obtain a third base substrate consisting of a second AlN single crystal; and v) growing a second AlN single crystal layer over the polished surface of the third base substrate.
    Type: Grant
    Filed: March 22, 2017
    Date of Patent: November 3, 2020
    Assignee: TOKUYAMA CORPORATION
    Inventors: Toru Nagashima, Reiko Okayama, Masayuki Fukuda, Hiroyuki Yanagi
  • Publication number: 20190093255
    Abstract: A method for producing an AlN single crystal substrate, the method including: i) preparing a first base substrate consisting of a first AlN single crystal; ii) growing a first AlN single crystal layer over a main face of the first base substrate, to obtain a layered body; iii) cutting the first MN single crystal layer of the layered body, to separate the layered body into a second base substrate and a first part of the first AlN single crystal layer, the second base substrate including the first base substrate and a thin film layered thereon, the thin film being a second part of the first AlN single crystal layer; iv) polishing a surface of the thin film, to obtain a third base substrate consisting of a second AlN single crystal; and v) growing a second AlN single crystal layer over the polished surface of the third base substrate.
    Type: Application
    Filed: March 22, 2017
    Publication date: March 28, 2019
    Applicant: TOKUYAMA CORPORATION
    Inventors: Toru NAGASHIMA, Reiko OKAYAMA, Masayuki FUKUDA, Hiroyuki YANAGI
  • Patent number: 9708733
    Abstract: The method for manufacturing an aluminum-based group III nitride single crystal includes the step of supplying an aluminum halide gas and a nitrogen source gas onto a base substrate, such that a reaction of the aluminum halide gas and the nitrogen source gas is conducted on the base substrate, wherein the reaction of the aluminum halide gas and the nitrogen source gas is conducted under coexistence of a halogen-based gas such that a halogen-based gas ratio (H) represented by the following formula (1) is no less than 0.1 and less than 1.0: H=VH/(VH+VAl)??(1) (In the formula (1), VH represents a supply of the halogen-based gas; and VAl represents a supply of the aluminum halide gas); and a growth rate of the aluminum-based group III nitride single crystal is no less than 10 ?m/h.
    Type: Grant
    Filed: June 10, 2014
    Date of Patent: July 18, 2017
    Assignee: TOKUYAMA CORPORATION
    Inventors: Akinori Koukitsu, Yoshinao Kumagai, Toru Nagashima, Reiko Okayama
  • Publication number: 20160108554
    Abstract: The method for manufacturing an aluminum-based group III nitride single crystal includes the step of supplying an aluminum halide gas and a nitrogen source gas onto a base substrate, such that a reaction of the aluminum halide gas and the nitrogen source gas is conducted on the base substrate, wherein the reaction of the aluminum halide gas and the nitrogen source gas is conducted under coexistence of a halogen-based gas such that a halogen-based gas ratio (H) represented by the following formula (1) is no less than 0.1 and less than 1.0: H=VH/I(VH+VAl)??(1) (In the formula (1), VH represents a supply of the halogen-based gas; and VAl represents a supply of the aluminum halide gas); and a growth rate of the aluminum-based group III nitride single crystal is no less than 10 ?m/h.
    Type: Application
    Filed: June 10, 2014
    Publication date: April 21, 2016
    Inventors: Akinori KOUKITSU, Yoshinao KUMAGAI, Toru NAGASHIMA, Reiko OKAYAMA