Patents by Inventor Reiner Burgschat
Reiner Burgschat has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7719075Abstract: A scanning head for an optical position-measuring system includes a receiver grating, formed of photosensitive areas, for the scanning of locally intensity-modulated light of differing wavelengths. The receiver grating is formed from a semiconductor layer stack of a doped p-layer, an intrinsic i-layer and a doped n-layer. The individual photosensitive areas have a first doped layer and at least a part of the intrinsic layer in common and are electrically separated from one another by interruptions in the second doped layer.Type: GrantFiled: July 29, 2004Date of Patent: May 18, 2010Assignee: Dr. Johannes Heidenhain GmbHInventors: Peter Speckbacher, Josef Weidmann, Christopher Eisele, Elmar Mayer, Reiner Burgschat
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Publication number: 20070278486Abstract: A scanning head for an optical position-measuring system includes a receiver grating, formed of photosensitive areas, for the scanning of locally intensity-modulated light of differing wavelengths. The receiver grating is formed from a semiconductor layer stack of a doped p-layer, an intrinsic i-layer and a doped n-layer. The individual photosensitive areas have a first doped layer and at least a part of the intrinsic layer in common and are electrically separated from one another by interruptions in the second doped layer.Type: ApplicationFiled: July 29, 2004Publication date: December 6, 2007Inventors: Peter Speckbacher, Josef Weidmann, Christopher Eisele, Elmar Mayer, Reiner Burgschat
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Patent number: 7301140Abstract: A scanning device for scanning a scale graduation for detecting relative movements of the scanning device with respect to the scale graduation. The scanning device includes a first primary sensor field and a second primary sensor field used for detecting relative movements along a first spatial direction. A first secondary sensor field and a second secondary sensor field for detecting relative movements along a second spatial direction, which is linearly independent of the first spatial direction. The first primary sensor field, the second primary sensor field, the first secondary sensor field and the second secondary sensor field are arranged point-symmetrically in relation to a mid-point in a plane.Type: GrantFiled: January 28, 2005Date of Patent: November 27, 2007Inventors: Reiner Burgschat, Manfred Matz
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Patent number: 7123354Abstract: An optical position measuring arrangement that includes an incremental measuring graduation and a scanning unit, which can be moved in relation to the incremental measuring graduation along a measuring direction and by which position-dependent incremental signals are generated from scanning the measuring graduation. The scanning unit includes a transparent support substrate and two incremental signal scanning arrangements arranged in the measuring direction. Each of the incremental scanning arrangements includes a light source and several incremental signal detector elements, wherein the incremental signal scanning arrangements are arranged on a side of the support substrate facing away from the incremental measuring graduation.Type: GrantFiled: March 28, 2002Date of Patent: October 17, 2006Assignee: Dr. Johannes Heidenhain GmbHInventors: Reiner Burgschat, Janos Böhme, Manfred Matz
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Patent number: 6993853Abstract: A device for the directional attachment of a scale element of a linear position measuring system to an installation face of a first body. The device includes a first body, a second body comprising a scanning head, which is movable in a measuring direction in relation to said first body, and a scale element is aligned parallel with respect to the measuring direction and a profiled alignment device is provided on the second body, which works together with a complementary tape profile on the scale element for aligning the scale element.Type: GrantFiled: October 15, 2004Date of Patent: February 7, 2006Assignee: Dr. Johannes Heidenhain GmbHInventors: Reiner Burgschat, Robert Stelzner
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Patent number: 6973399Abstract: A circuit arrangement for the correction of periodic signals from an incremental position measuring system that includes a first assembly comprising a multiplexer having an input to which a periodic signal is supplied and an output out of which an output signal is transmitted, a second assembly that receives the output signal and compares the output signal with at least one preset threshold value and, the second assembly selects a manipulated variable as a function of an actual position of a signal parameter in relation to the at least one preset threshold value from at least two preset, different manipulated variables and an actuating member that performs an action on the signal parameter in order to adjust the signal parameter in a direction toward a preset setpoint value.Type: GrantFiled: March 22, 2000Date of Patent: December 6, 2005Assignee: Dr. Johannes Heidenhain GmbHInventors: Reiner Burgschat, Mathias Krauss
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Publication number: 20050174111Abstract: A scanning device for scanning a scale graduation for detecting relative movements of the scanning device with respect to the scale graduation. The scanning device includes a first primary sensor field and a second primary sensor field used for detecting relative movements along a first spatial direction. A first secondary sensor field and a second secondary sensor field for detecting relative movements along a second spatial direction, which is linearly independent of the first spatial direction. The first primary sensor field, the second primary sensor field, the first secondary sensor field and the second secondary sensor field are arranged point-symmetrically in relation to a mid-point in a plane.Type: ApplicationFiled: January 28, 2005Publication date: August 11, 2005Inventors: Reiner Burgschat, Manfred Matz
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Patent number: 6904696Abstract: A method for the directional attachment of a scale element of a position measuring system to an installation face of a first body. The method includes aligning a scale element on an installation face of a first body parallel to a measuring direction via an adjustment device provided on a second body, which has a scanning head provided thereon and is movable in the measuring direction in relation to the first body. Attaching the aligned scale element to the installation face, wherein the adjustment device is in an alignment position with respect to the second body during the attaching. Positioning the adjustment device into a position of rest with respect to the second body subsequent to the attaching, wherein the position of rest is different from the alignment position.Type: GrantFiled: July 2, 2003Date of Patent: June 14, 2005Assignee: Dr. Johannes Heidenhain GmbHInventors: Ludwig Böge, Reiner Burgschat, Wolfgang Sachse
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Publication number: 20050108888Abstract: A device for the directional attachment of a scale element of a linear position measuring system to an installation face of a first body. The device includes a first body, a second body comprising a scanning head, which is movable in a measuring direction in relation to said first body, and a scale element is aligned parallel with respect to the measuring direction and a profiled alignment device is provided on the second body, which works together with a complementary tape profile on the scale element for aligning the scale element.Type: ApplicationFiled: October 15, 2004Publication date: May 26, 2005Inventors: Reiner Burgschat, Robert Stelzner
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Patent number: 6865820Abstract: A device for the directional attachment of a scale element of a linear position measuring system to an installation face of a first body. The device includes a first body, a second body comprising a scanning head, which is movable in a measuring direction in relation to said first body, and a scale element is aligned parallel with respect to the measuring direction and a profiled alignment device is provided on the second body, which works together with a complementary tape profile on the scale element for aligning the scale element.Type: GrantFiled: July 2, 2003Date of Patent: March 15, 2005Assignee: Dr. Johannes Heidenhain GmbHInventors: Reiner Burgschat, Robert Stelzner
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Patent number: 6807499Abstract: A method for generating an indication regarding the amplitude level of at least one scanning signal of a position measuring system by determining an amplitude level of at least one scanning signal of a position measuring system, generating an amplitude signal based on the determined amplitude level. Forming a deviation signal by comparing the generated amplitude signal with a predetermined nominal signal and providing an indication of a proper set-up of a scanning head of the position measuring system as a function of the deviation signal, wherein with a weak deviation signal, a change in the deviation signal causes a small, or no variation of the indication, and in contrast thereto a larger variation of the indication is caused by a stronger deviation signal.Type: GrantFiled: November 21, 2002Date of Patent: October 19, 2004Assignee: Johannes Heidenhain GmbHInventors: Reiner Burgschat, Werner Metzner, Robert Stelzner
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Publication number: 20040154180Abstract: A device for the directional attachment of a scale element of a linear position measuring system to an installation face of a first body. The device includes a first body, a second body comprising a scanning head, which is movable in a measuring direction in relation to said first body, and a scale element is aligned parallel with respect to the measuring direction and a profiled alignment device is provided on the second body, which works together with a complementary tape profile on the scale element for aligning the scale element.Type: ApplicationFiled: July 2, 2003Publication date: August 12, 2004Inventors: Reiner Burgschat, Robert Stelzner
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Publication number: 20040101341Abstract: A method for the directional attachment of a scale element of a position measuring system to an installation face of a first body. The method includes aligning a scale element on an installation face of a first body parallel to a measuring direction via an adjustment device provided on a second body, which has a scanning head provided thereon and is movable in the measuring direction in relation to the first body. Attaching the aligned scale element to the installation face, wherein the adjustment device is in an alignment position with respect to the second body during the attaching. Positioning the adjustment device into a position of rest with respect to the second body subsequent to the attaching, wherein the position of rest is different from the alignment position.Type: ApplicationFiled: July 2, 2003Publication date: May 27, 2004Inventors: Ludwig Boge, Reiner Burgschat, Wolfgang Sachse
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Publication number: 20040026603Abstract: A method for generating an indication regarding the amplitude level of at least one scanning signal of a position measuring system by determining an amplitude level of at least one scanning signal of a position measuring system, generating an amplitude signal based on the determined amplitude level. Forming a deviation signal by comparing the generated amplitude signal with a predetermined nominal signal and providing an indication of a proper set-up of a scanning head of the position measuring system as a function of the deviation signal, wherein with a weak deviation signal, a change in the deviation signal causes a small, or no variation of the indication, and in contrast thereto a larger variation of the indication is caused by a stronger deviation signal.Type: ApplicationFiled: November 21, 2002Publication date: February 12, 2004Inventors: Reiner Burgschat, Werner Metzner, Robert Stelzner
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Patent number: 6605828Abstract: An optoelectronic component that includes a substrate having a first optoelectronic component, a second optoelectronic component arranged next to the first optoelectronic component and a contact point. A support of the substrate includes a second contact point, wherein the second contact point is located opposite to the first contact point and is in electrical connection with the first contact point. An underfiller in a space between the substrate and the support, the underfiller forms a border area between the substrate and the support toward a space free of underfiller, wherein the border area restricts the space free of underfiller of at least one of the first and second optoelectronic components.Type: GrantFiled: January 2, 2002Date of Patent: August 12, 2003Assignee: Dr. Johanns Hudenheim GmbHInventors: Günter Schwarzrock, Reiner Burgschat, Andreas Schmidt, Wolfgang Brode, Wolfgang Holzapfel, Peter Speckbacher, Dieter Michel
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Patent number: 6545262Abstract: A position measuring system for determining the relative position of a first object and a second object movable relative to one another that includes an incremental track, associated with a first object and having a periodic line structure that has individual lines and a scanning unit, associated with a second object movable relative to the first object, that scans said periodic line structure and that generates a corresponding incremental signal. A sensor system that generates absolute position information pertaining to the relative position of the first and second objects, wherein the width of the individual lines, as measured along a longitudinal direction of the incremental track, varies over at least a portion of the breadth of the incremental track, as measured in a direction transverse to the longitudinal direction, in such a way that a structure with absolute position information is superimposed on the periodic line structure.Type: GrantFiled: June 2, 2000Date of Patent: April 8, 2003Assignee: Dr. Johannes Heidenhein GmbHInventor: Reiner Burgschat
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Publication number: 20030062470Abstract: A position measuring system for determining the relative position of a first object and a second object movable relative to one another that includes an incremental track, associated with a first object and having a periodic line structure that has individual lines and a scanning unit, associated with a second object movable relative to the first object, that scans said periodic line structure and that generates a corresponding incremental signal. A sensor system that generates absolute position information pertaining to the relative position of the first and second objects, wherein the width of the individual lines, as measured along a longitudinal direction of the incremental track, varies over at least a portion of the breadth of the incremental track, as measured in a direction transverse to the longitudinal direction, in such a way that a structure with absolute position information is superimposed on the periodic line structure.Type: ApplicationFiled: November 7, 2002Publication date: April 3, 2003Applicant: Dr. Johannes Heidenhain GmbHInventors: Reiner Burgschat, Joerg Willhelm
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Patent number: 6525311Abstract: A scanning unit for an optical position measuring device, which is suitable for scanning a scale in a measurement direction. The scanning unit includes a light source, an incremental signal scanning arrangement, disposed symmetrical around the light source and including a plurality of incremental signal detector elements, which are each disposed relative to one another so that phase-offset partial incremental signals are generated from the scanning of an incremental grating line of a scale. A first reference pulse detector element and a second reference pulse detector element, each of which is disposed vertically to a measurement direction and are each adjacent to the incremental signal scanning arrangement and generate an output reference pulse signal from the scanning of a first reference marking and a second reference marking located at one or more defined reference positions of the scale.Type: GrantFiled: November 3, 2000Date of Patent: February 25, 2003Assignee: Dr. Johannes Heidenhain GmbHInventor: Reiner Burgschat
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Patent number: 6476380Abstract: A three-dimensional measuring module includes an optical chip arranged spatially above a scanning plate and a signal processing assembly arranged above the optical chip. A housing completely encloses the optical chip and the signal processing assembly as well as a scanning plate. The electrical connecting lines between the optical chip and the signal processing assembly are routed via the scanning plate and the interior side of the housing to the signal processing assembly. The output signals of the signal processing assembly are conveyed via connecting lines to contacts on the exterior side of the housing. The conductive lines between the optical chip and the signal processing assembly can be kept very short, so that line resistance and interference coupling are reduced.Type: GrantFiled: December 3, 1999Date of Patent: November 5, 2002Assignee: Johannes Heidenhain GmbHInventor: Reiner Burgschat
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Patent number: 5841134Abstract: A photoelectric path- and angle-measurement system for measuring the displacement of two objects relative to one another comprises a quantity N=n.multidot.4 of photoreceivers which are arranged in a photoreceiver matrix in such a way that the diagonals of the photoreceivers lie parallel to the diagonals of the photoreceiver matrix and the photoreceivers which detect the same phase position are electrically connected with one another, and these signals are fed to an evaluating circuit.Type: GrantFiled: March 26, 1997Date of Patent: November 24, 1998Assignee: Carl Zeiss Jena GmbHInventors: Reiner Burgschat, Joerg Willhelm