Abstract: Systems and circuits directed to a time-of-flight measurement system are provided. More specifically, an illustrative optical sensor is disclosed to include a plurality of avalanche photodiodes, at least one of the plurality of avalanche photodiodes being in communication with amplifier common node through an impedance converter that is responsive to a control signal and selectively connects or disconnects the at least one avalanche photodiode from the common node based on the control signal. In an example, the impedance converter is also configured to preserve current generated from the at least one avalanche photodiode.

Abstract: Systems and circuits directed to a time-of-flight measurement system are provided. More specifically, an illustrative optical sensor is disclosed to include a plurality of avalanche photodiodes, at least one of the plurality of avalanche photodiodes being in communication with amplifier common node through an impedance converter that is responsive to a control signal and selectively connects or disconnects the at least one avalanche photodiode from the common node based on the control signal. In an example, the impedance converter is also configured to preserve current generated from the at least one avalanche photodiode.

Abstract: Systems and circuits directed to a time-of-flight measurement system are provided. More specifically, the time-of-flight measurement system may include an optical sensor module including a substrate of a first conductivity type having an epitaxial layer disposed thereon, a photodetector formed in the first epitaxial layer, a deep well of a second conductivity type formed in the first epitaxial layer, a deep well of the first conductivity type formed in the deep well of the second conductivity type, a well of the second conductivity type formed in the deep well of the first conductivity type, and a well of the first conductivity type formed in the deep well of the first conductivity type. The time-of-flight measurement system may include control logic configured to determine a distance based on a time-of-flight value received from the photodetector.

Abstract: An optical measurement system is provided for performing time-of-flight distance measurement with ambient light suppression. The system has a detector circuit that includes a photodetector and an additional current gain element that amplifies the photocurrent produced by the photodetector. Placement of the additional current gain element near the photodetector allows low-power optical signals to be detected without amplifying noise from sources of the system that are outside of the detector circuit, thereby allowing a high signal-to-noise ratio to be achieved. Embodiments of the system include circuitry that automatically regulates the bias voltage of the photodetector to compensate for temperature and for fabrication process variations.

Abstract: An optical measurement system is provided for performing time-of-flight distance measurement with ambient light suppression. The system has a detector circuit that includes a photodetector and an additional current gain element that amplifies the photocurrent produced by the photodetector. Placement of the additional current gain element near the photodetector allows low-power optical signals to be detected without amplifying noise from sources of the system that are outside of the detector circuit, thereby allowing a high signal-to-noise ratio to be achieved. Embodiments of the system include circuitry that automatically regulates the bias voltage of the photodetector to compensate for temperature and for fabrication process variations.