Abstract: A test system (10) for testing an electric device (30), in particular a high-voltage device, has a portable main device (100) with a housing (140), an electric connection assembly (120, 121) and a mechanical connection assembly (145) and has a portable additional device (200, 300) with a separate housing (240, 340), an electric connection assembly (220, 320) and a mechanical connection assembly (245). The main device (100) can be mechanically connected to the additional device (200, 300) in a releasable manner by coupling the mechanical connection assemblies (145, 245) to form a structural unit, wherein the main device (100) can be electrically connected to the additional device (200, 300) via the first electric connection assemblies (120, 121, 220, 320).

Abstract: The invention relates to a high-voltage transformer which is configured as a toroidal transformer. The high-voltage transformer has a magnetizable core (310) and a high-voltage winding (330) and a low-voltage winding (320) around the magnetizable core (310). The high-voltage winding (330) is embodied at least partially as a pilgrim step winding.

Abstract: A transformer test device (10) for testing a transformer (40) has connections (12) for releasably connecting the transformer test device (10) to the transformer (40). The transformer test device (10) has a source (13) for generating a test signal for testing the transformer (40). The transformer test device (10) has a controllable switching means (15) which is connected to the connections (12) during a transformer test for the purpose of short-circuiting at least one winding (42) of the transformer (40).

Abstract: A test device is configured for testing a specimen which has an inductor. The test device includes a controllable unit for reducing a current intensity of a current flowing in the inductor.

Abstract: A test device is configured for testing a specimen which has an inductor. The test device includes a controllable unit for reducing a current intensity of a current flowing in the inductor.

Abstract: A transformer test device (10) for testing a transformer (40) has connections (12) for releasably connecting the transformer test device (10) to the transformer (40). The transformer test device (10) has a source (13) for generating a test signal for testing the transformer (40). The transformer test device (10) has a controllable switching means (15) which is connected to the connections (12) during a transformer test for the purpose of short-circuiting at least one winding (42) of the transformer (40).

Abstract: An apparatus and method for the measurement of a resistance of a switching contact of an electrical circuit breaker. A first resistance value across the circuit breaker is determined while the circuit breaker is grounded at both sides and the switching contact is closed. Further, a second resistance value across the circuit breaker is determined while the circuit breaker is grounded at both sides and the switching contact is open. The resistance of the closed switching contact is then determined based on the first resistance value and the second resistance value.

Abstract: An apparatus and method for the measurement of a resistance of a switching contact of an electrical circuit breaker. A first resistance value across the circuit breaker is determined while the circuit breaker is grounded at both sides and the switching contact is closed. Further, a second resistance value across the circuit breaker is determined while the circuit breaker is grounded at both sides and the switching contact is open. The resistance of the closed switching contact is then determined based on the first resistance value and the second resistance value.

Abstract: A test device (1) for testing power engineering equipment comprises at least one connection socket (4) which is electrically connected to an overvoltage protection arrangement (2). The overvoltage protection arrangement (2) comprises at least one overvoltage protection element (5) and is configured such that the at least one overvoltage protection element (5) is exchangeable.

Abstract: An apparatus and method for the measurement of a resistance of a switching contact of an electrical circuit breaker. A first resistance value across the circuit breaker is determined while the circuit breaker is grounded at both sides and the switching contact is closed. Further, a second resistance value across the circuit breaker is determined while the circuit breaker is grounded at both sides and the switching contact is open. The resistance of the closed switching contact is then determined based on the first resistance value and the second resistance value.

Abstract: A test device (1) for testing power engineering equipment comprises at least one connection socket (4) which is electrically connected to an overvoltage protection arrangement (2). The overvoltage protection arrangement (2) comprises at least one overvoltage protection element (5) and is configured such that the at least one overvoltage protection element (5) is exchangeable.

Abstract: There is described a fully automatic portable testing device which can be used generally for testing test-pieces to be operated at high voltages and/or high currents, such as current or voltage transducers or transformers for example. For this purpose, the portable testing device comprises a switched-mode power amplifier (3) whose output is connected to a matching transformer (4-7) having a plurality of secondary windings (5-7), which can be changed over. The test-piece on which measurements are to be made is in each case removably connected to the secondary windings (5-7) of the matching transformer. The portable testing device also comprises a control which in particular may have a digital signal processor (8) and/or a controller or computer (9) and which on the one hand controls the power amplifier (3) in a purposive way and preferably also performs an automatic changeover of the secondary windings (5-7) of the matching transformer, in order to generate a desired testing signal.

Abstract: There is described a fully automatic portable testing device which can be used generally for testing test-pieces to be operated at high voltages and/or high currents, such as current or voltage transducers or transformers for example. For this purpose, the portable testing device comprises a switched-mode power amplifier (3) whose output is connected to a matching transformer (4-7) having a plurality of secondary windings (5-7) which can be changed over. The test-piece on which measurements are to be made is in each case to be connected to the secondary windings (5-7) of the matching transformer. The portable testing device also comprises a control which in particular may have a digital signal processor (8) and/or a controller or computer (9) and which on the one hand controls the power amplifier (3) in a purposive way and preferably also performs an automatic changeover of the secondary windings (5-7) of the matching transformer, in order to generate a desired testing signal.

Abstract: A process for centrifugal coating of large-surface, arched elements, especially of cathode-ray-tube displays or screens, in which during the centrifugal coating, a disk matched to approximately the shape of the surface to be coated is rotated at a distance of 1 to 10 mm above the surface to be coated at approximately the centrifugal speed equidirectional with the surface to be coated.

Abstract: In a process for producing transparent, electrically conductive, augmented layers of indium oxide by means of a dipping process, during which the substrate to be coated is dipped into a solution containing hydrolyzable compounds of indium, whereupon the substrate is withdrawn from the solution, is dried, and tempered at temperatures of up to 500.degree. C., a dipping solution is used which, in addition to the indium compound, contains at least one additional hydrolyzable compound of an element in the 2nd, 4th or 5th main groups, in the 1st, 2nd, 4th, 5th or 8th subgroup of the periodic system of elements, or of the rare earths.

Abstract: A process for the production of transparent, electrically conductive, infrared-reflecting indium oxide-tin oxide layers, especially on glass panes, involves steps wherein the glass panes are dipped into a first solution containing a hydrolyzable silicon compound and hydrolyzable compounds of titanium, zirconium, aluminum, tin or tantalum;the glass panes are heated up to 450.degree. C. in a moisture-containing atmosphere;the initially coated panes are dipped into a second solution containing hydrolyzable compounds of indium and of tin;the panes are dried at temperatures below 250.degree. C.; andthe panes are finally heated up to 550.degree. C. in a reducing atmosphere.