Patents by Inventor Reinhard Schachtner

Reinhard Schachtner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and devices for the computer-aided determination of deviation patterns during the production and/or testing of a multiplicity of dies and computer program products
    Patent number: 9970983
    Abstract: In various embodiments, a method for the computer-aided determination of deviation patterns during at least one of the production or testing of a multiplicity of dies is provided. The dies are uniquely identified. The method may include determining, for each die of the multiplicity of dies and for at least one measurement process of a plurality of measurement processes which are applied to at least one portion of the dies, a measurement value which was determined in the measurement process for the respective die; and carrying out a blind source separation using the measurement values, thereby determining the deviation patterns for the dies.
    Type: Grant
    Filed: February 3, 2015
    Date of Patent: May 15, 2018
    Assignee: Infineon Technologies AG
    Inventors: Reinhard Schachtner, Gerhard Poeppel
  • METHODS AND DEVICES FOR THE COMPUTER-AIDED DETERMINATION OF DEVIATION PATTERNS DURING THE PRODUCTION AND/OR TESTING OF A MULTIPLICITY OF DIES AND COMPUTER PROGRAM PRODUCTS
    Publication number: 20150219715
    Abstract: In various embodiments, a method for the computer-aided determination of deviation patterns during at least one of the production or testing of a multiplicity of dies is provided. The dies are uniquely identified. The method may include determining, for each die of the multiplicity of dies and for at least one measurement process of a plurality of measurement processes which are applied to at least one portion of the dies, a measurement value which was determined in the measurement process for the respective die; and carrying out a blind source separation using the measurement values, thereby determining the deviation patterns for the dies.
    Type: Application
    Filed: February 3, 2015
    Publication date: August 6, 2015
    Inventors: Reinhard Schachtner, Gerhard Poeppel