Abstract: The present invention relates to signal and power supply transmission for an X-ray source. In order to provided an improved signal and power supply transmission with reduced constructional complexity and enhanced operation possibilities, an integrated signal and power supply transmission arrangement is provided, comprising a supply board (12), a main board (14), an insulating plate (16), at least one transformer arrangement (18), and at least one signal transmission arrangement (20). The insulating plate is provided between the supply and the main board. The transformer arrangement is provided to supply electric energy to the driving circuit of a transistor, which in turn feeds an X-ray source. The transformer arrangement comprises a primary electric conductor arranged on the supply board to cause electromagnetic induction in a secondary electric conductor arranged on the main board.

Abstract: The present invention relates to signal and power supply transmission for an X-ray source. In order to provided an improved signal and power supply transmission with reduced constructional complexity and enhanced operation possibilities, an integrated signal and power supply transmission arrangement is provided, comprising a supply board (12), a main board (14), an insulating plate (16), at least one transformer arrangement (18), and at least one signal transmission arrangement (20). The insulating plate is provided between the supply and the main board. The transformer arrangement is provided to supply electric energy to the driving circuit of a transistor, which in turn feeds an X-ray source. The transformer arrangement comprises a primary electric conductor arranged on the supply board to cause electromagnetic induction in a secondary electric conductor arranged on the main board.

Abstract: The invention is directed to a highly sensitive spectrum analysis unit with a diffraction grating, wherein a parallel light bundle having a wavelength range impinges on a diffraction grating which splits the different wavelengths into spectra by diffraction in first directions, and wavelength partial ranges of the spectrally split light bundle can be focused on a detector row by means of camera optics, and evaluation electronics are connected to the detector row and acquire the generated spectrum as information and display it. The invention is characterized in that the light bundle passes a first optical element, and then wavelength partial ranges of a spectrally split light bundle impinge on respective partial regions of a diffraction grating, the diffraction grating having the same grating constant across all partial regions and a changing profile shape, the profile shapes generating different blaze wavelengths that lie in the respective wavelength partial ranges.

Abstract: The invention is directed to a highly sensitive spectrum analysis unit with a diffraction grating, wherein a parallel light bundle having a wavelength range impinges on a diffraction grating which splits the different wavelengths into spectra by diffraction in first directions, and wavelength partial ranges of the spectrally split light bundle can be focused on a detector row by means of camera optics, and evaluation electronics are connected to the detector row and acquire the generated spectrum as information and display it. The invention is characterized in that the light bundle passes a first optical element, and then wavelength partial ranges of a spectrally split light bundle impinge on respective partial regions of a diffraction grating, the diffraction grating having the same grating constant across all partial regions and a changing profile shape, the profile shapes generating different blaze wavelengths that lie in the respective wavelength partial ranges.

Abstract: A controller for controlling the dose rate (exposure kV tube voltage) of an X-ray system, in which the actual dose rate is measured and compared with an optimal dose rate, and the resultant difference value is fed to a module (20) (e.g. a PID module) which is arranged to adjust the dose rate (by adjusting the exposure kV voltage) so as to minimize the difference value. No preset parameters are required to be entered prior to exposure.

Abstract: A controller for controlling the dose rate (exposure kV tube voltage) of an X-ray system, in which the actual dose rate is measured and compared with an optimal dose rate, and the resultant difference value is fed to a module (20) (e.g. a PID module) which is arranged to adjust the dose rate (by adjusting the exposure kV voltage) so as to minimise the difference value. No preset parameters are required to be entered prior to exposure.

Abstract: The invention relates to a method of controlling the exposure of an X-ray image. Starting values for the tube current, the tube voltage and the exposure duration are hereby set on the X-ray tube (10). Following the start of the exposure, the resultant dose rate is measured by a sensor (30, 31) and made available to a control system (100, 200, 300). In order to achieve a predetermined dose for the X-ray image, the control system adjusts the following variables in succession: the tube current within a current range; if applicable, the exposure duration within a time slot; the tube voltage within a voltage range; the exposure duration within the time slot. A rapid controlling of the tube current is enabled, preferably by the pulse-width modulation of the counter-voltage at the control grid of the X-ray tube.

Abstract: In imaging optics with main optics having several optical elements, and in which the main optics are corrected for an observation radiation, there is further provided a transmissive, diffractive element, which is arranged and provided in the observation beam path of the imaging optics such that, due to the diffractive effect of the diffractive element, at least one aberration of the main optics is corrected for an inspection radiation having a different wavelength than that of the observation radiation.

Abstract: The invention relates to a method of controlling the exposure of an X-ray image. Starting values for the tube current, the tube voltage and the exposure duration are hereby set on the X-ray tube (10). Following the start of the exposure, the resultant dose rate is measured by a sensor (30, 31) and made available to a control system (100, 200, 300). In order to achieve a predetermined dose for the X-ray image, the control system adjusts the following variables in succession: the tube current within a current range; if applicable, the exposure duration within a time slot; the tube voltage within a voltage range; the exposure duration within the time slot. A rapid controlling of the tube current is enabled, preferably by the pulse-width modulation of the counter-voltage at the control grid of the X-ray tube.

Abstract: A system for recording and playing back pictures of objects according to the time slice technology comprises a camera arrangement including several cameras simultaneously capturing pictures of at least one object, a storage assembly for storing all captured pictures, a display assembly for displaying captured pictures, and a control unit for controlling the camera arrangement, the storage assembly and the display assembly. The cameras, in each case, are high speed video cameras having high resolution adapted to capture a great number of pictures per second which all are stored in the storage assembly and then can be retrieved from the storage assembly in arbitrary sequence for creating movie sequences.

Abstract: In an adjusting device for displacing individual elements (2) of optical systems or of measuring systems in which the element to be displaced is movable on a base (1) along a predetermined direction (x) by means of a piezoelectric actuator arrangement (21, 22) which is supported by the element (2) and which is constructed and controllable in such a way that it exerts shock pulses on the element (2) in order to carry out a stepwise movement of the element (2) on the base (1), the element (2) is arranged in a body (1; 27) which has an open or closed hollow cross section and is supported in a frictional engagement on this body, at least at one location, with the intermediary of a pretensioned spring device (8, 8?).

Abstract: In an objective (1), in particular a microscope objective, said objective comprising an object-side first optical group (5) with a positive refractive power, and a second optical group (6), arranged following the first optical group (5), with a negative refractive power, and said first optical group (5) including several refractive elements (7, 8, 9, 10), the first optical group (5) comprises at least one diffractive element (11) having a refraction-enhancing and achromatizing effect.

Abstract: In a measurement arrangement comprising a source of radiation (1), a subsequently arranged deflecting device (5), onto which a beam (2) emitted by the source of radiation (1) can be directed and which beam it deflects in different directions in a time-sequential manner, and further comprising first and second optical devices (9, 10) as well as a detector (6), the first optical device (9) deflecting each of the beams coming from the deflecting device (5) as a beam of measurement onto a point (P) on a specimen (11) to be arranged in a position for measurement, so that the angle of incidence of the beam of measurement on the specimen (11) varies as a function of the direction, and wherein specimen beams coming from the specimen due to the interaction of the beams of measurement with the specimen are deflected onto the detector (11) by means of the second optical device (10), at least one of said two optical devices (9, 10) comprises a diffractive element (7) for deflection, by which the beams incident from diffe

Abstract: In an objective, in particular a microscope objective, wherein the objective has a first optics group on the object side with positive refractive power and a second optics group with negative refractive power following the first optics group, and wherein the first optics group contains a plurality of refractive elements, the first optics group contains at least one diffractive element with a refraction-increasing and achromatizing effect.

Abstract: In an adjusting device for displacing individual elements (2) of optical systems or of measuring systems in which the element to be displaced is movable on a base (1) along a predetermined direction (x) by means of a piezoelectric actuator arrangement (21, 22) which is supported by the element (2) and which is constructed and controllable in such a way that it exerts shock pulses on the element (2) in order to carry out a stepwise movement of the element (2) on the base (1), the element (2) is arranged in a body (1; 27) which has an open or closed hollow cross section and is supported in a frictional engagement on this body, at least at one location, with the intermediary of a pretensioned spring device (8, 8′).

Abstract: A microscope system for detecting the emission distribution of specimens which emit light at least in a punctiform manner, particularly for failure analysis of integrated circuits, comprises an imaging beam path from the specimen in the direction of an at least one-dimensional receiver distribution, wherein at least one element is provided in the imaging beam path for spectral division of the light which is emitted at least in a punctiform manner.