Abstract: The present invention relates to a cutter system for an electric shaver and/or trimmer, comprising a pair of comb-like cutting elements with cooperating toothed cutting edges and movably supported relative to each other by a support element, wherein lateral ends of at least one of the cutting elements are provided with lateral protection elements having rounded and/or chamfered edge contours for soft skin engagement, wherein the lateral protection element is enveloping and covering a gap movably receiving the other cutting element and/or enveloping the support element.

Abstract: A method for testing the tightness of a housing involves providing a pressure sensor in a housing, sealing the housing, and detecting a pressure level in the housing.

Abstract: A method for testing the tightness of a housing involves providing a pressure sensor in a housing, sealing the housing, and detecting a pressure level in the housing.

Abstract: A charged particle beam device is provided. The device includes an emitter for emitting a charged particle beam in a propagation direction essentially along an optical axis of the charged particle beam device, an aperture arrangement within the charged particle beam device.

Abstract: In the assembly of an electronic circuit module having a baseplate (10) and circuit components (16, 19, 21) mounted on said baseplate in an automatic assembly line in which a boat is placed on a conveyor means and is conveyed between various assembly stations in order to place, fix and/or contact the circuit components (16, 19, 21) on the boat, the boat is used as the baseplate (10) of the circuit module. When the circuit module is finished, the boat thus becomes part of a device where the module is built in.

Abstract: A circuit assembly comprises a circuit board, at least one circuit component connected to the circuit board by wire bonding, and a base plate, on which the circuit board is fixed. A gap between the base plate and the circuit board fixed to it is filled at least locally by a filling body made of a material hardened in the gap.

Abstract: In the assembly of an electronic circuit module having a baseplate and circuit components mounted on the baseplate in an automatic assembly line in which a boat is placed on a conveyor and is conveyed between various assembly stations in order to place, fix and/or contact the circuit components on the boat, the boat is used as the baseplate of the circuit module. When the circuit module is finished, the boat thus becomes part of a device where the module is built in.

Abstract: A method and a system for testing an electrical component in a non-contact manner at high speed with high reliability. The method includes the steps of positioning a primary particle beam onto the component, supplying an AC-signal to the electrode being positioned in front of the component and varying the frequency of the AC-signal, detecting secondary particles released at the component and penetrating the electrode to form a secondary particle signal, and evaluating the corresponding secondary particle signal.

Abstract: The invention relates to a charged particle beam device and a method for inspecting a specimen, comprising a source for generating a charged particle beam, an objective lens with an optical axis for focussing said charged particle beam on a specimen, which consists of a magnetic lens and a superimposed electrostatic lens having at least two electrodes, deflection means for deflecting said charged particle beam on said specimen and detector means for detecting charged particles released at said specimen. The invention is further characterized by control means co-acting with said deflection means and one of the electrodes of the electrostatic lens for applying a dynamic voltage to said electrode, the amount of the voltage being dependent on the distance of said charged particle beam from said optical axis at the specimen, in order to increase the efficiency of detecting said charged particles released at image areas being located on the specimen with distance from the optical axis.

Abstract: An optical unit having an electrostatic lens for influencing a particle beam wherein the lens has at least one first and one second electrode downstream of one another in the direction of the particle beam, each of the electrodes being chargeable with a potential and in electrical contact with a high-resistance body having a channel therethrough for the particle beam. A further component is provided for influencing the particle beam in the region of the electrostatic lens.

Abstract: A deflection system (6) for a charged particle beam (2), in particular for rrangement in an objective lens for a charged particle beam device with a deflection means (60) for generating a magnetic field acting on the charged particle beam (2) and a shield (61) for avoiding eddy currents, which surrounds the deflection means and guides the formed outer magnetic field. The shield (61) consists, transversely to the direction of the charged particle beam (2), of at least one soft magnetic layer which is preferably formed as a strip material and rolled up to a cylinder together with an electrically insulating layer.

Abstract: Method for particle beam testing of substrates for liquid crystal displays (LCD). This is directed to methods wherein, given a substrate (SUB1) for a liquid crystal display, either potentials or, respectively, currents are set in defined fashion with a particle beam (S1, S2 and S4) and/or potentials are measured by detecting secondary electrons (S5) at different switch statuses of the switch elements (T) of the substrate (SUB1). The geometrical integrity and the electrical functionability of the substrate (SUB1) are thereby tested, even though, for example, a supplementary plane electrode is not present for forming a capacitor. An important advantage of the method is that faulty substrates can be repaired or can be segregated even before further-processing and, thus, costs can be reduced.

Abstract: A process for the preparation of a hydroxyapatite, which is suitable as a tooth-cleaning substance, by precipitation from aqueous phosphoric acid and calcium hydroxide solution, in which a calcium-doped phosphoric acid solution is fed to an intensive mixer with a suspension of calcium hydroxide/oxide in a molar ratio of Ca:P=1.667 corresponding to the hydroxyapatite of and reacted there at precipitation temperatures of 60.degree.-100.degree. C., preferably 80.degree.-90.degree. C. and a pH of 4-8, preferably of 6.5-7.5. Also disclosed in a tooth-cleaning substance containing the hydroxyapatite.

Abstract: Method for particle beam testing of substrates for liquid crystal displays (LCD). This is directed to methods wherein, given a substrate (SUB1) for a liquid crystal display, either potentials or, respectively, currents are set in defined fashion with a particle beam (S1, S2 and S4) and/or potentials are measured by detecting secondary electrons (S5) at different switch statuses of the switch elements (T) of the substrate (SUB1). The geometrical integrity and the electrical functionability of the substrate (SUB1) are thereby tested, even though, for example, a supplementary plane electrode is not present for forming a capacitor. An important advantage of the method is that faulty substrates can be repaired or can be segregated even before further-processing and, thus, costs can be reduced.

Abstract: A particle beam testing method wherein with the assistance of at least one adjustment voltage, an actual specimen voltage boost is produced at a measuring point of a specimen and wherein a reference specimen voltage boost for the measuring point is supplied to a retarding field, and as a result, the actual specimen voltage boost corresponds to the reference specimen voltage boost of the measuring point and, thus, a detector current remains constant so long as the specimen is fault-free.

Abstract: Method for particle beam testing of substrates for liquid crystal displays (LCD). This invention is directed to methods wherein, given a substrate (SUB1) for a liquid crystal display, either potentials or, respectively, currents are set in defined fashion with a particle beam (S1, S2 and S4) and/or potentials are measured by detecting secondary electrons (S5) at different switch statuses of the switch elements (T) of the substrate (SUB1). The geometrical integrity and the electrical functionability of the substrate (SUB1) are thereby tested, even though, for example, a supplementary plane electrode is not present for forming a capacitor. An important advantage of the method is that faulty substrates can be repaired or can be segregated even before further-processing and, thus, costs can be reduced.

Abstract: For testing an interconnect network for shorts and interruptions, a point of the network to be tested is charged with a particle beam. Subsequently, a potential at least one further contact point is read with the same particle beam and an unaltered primary energy. An identification of potential occurs by documenting the secondary electrons triggered at the contact points. In order to avoid a disturbing change of potential during the measuring phase, the measuring time is only a fraction of the time for charging the network.

Abstract: A circuit includes an inversely fedback operational amplifier having a saw tooth deflection signal applied at its input, as well as a coil pair and an output for deflecting the particle beam of a scanning microscope within a scanned field as established by the coil current. A plurality of resistor elements are selected by a switch and a constant current source for feeding a direct current is provided to effect the image displacement at a connection P between the coil pair and respective one of the resistor elements. Since the direct current flows only through the coils but not through the resistor elements as a consequence of the feedback amplifier, image displacement is independent of magnification established by the respective resistor element.

Abstract: To measure high frequency signal curves at nodes and interconnections of integrated circuits and achieve a good chronological resolution in accordance with the sampling method, extremely short primary electron pulses are used. For such extremely short pulse widths obtainable with beam blanking systems, only individual statistically appearing secondary electrons are registered per pulse, these electrons generating current pulses having different amplitudes and different time behaviors at the output of an energy analyzer. It is proposed that the number of current pulses occurring at the output of the energy analyzer within a prescribed time interval be identified and the quotient, or ratio, thereof, be kept constant with the assistance of a feedback circuit for connection to the voltage of a retarding field electrode. The feedback circuit includes a pulse counter, a digital-to-analog converter, and a spectrometer drive.

Abstract: An arrangement for electrically testing microinterconnections with electric test contacts may be used given drastically-reduced dimensions of electric conductors and of the grid dimensions in printed circuitboards. The electric test contacts are selectable by way of internal switches. The test contacts can be disposed in a matrix whose grid dimension corresponds to the grid dimension of a printed circuitboard to be tested.