Patents by Inventor Remaerd Hsieh

Remaerd Hsieh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7079960
    Abstract: A new method and system of testing and classifying semiconductor devices is provided. User requirements are collected for this purpose, test specifications and test functions are defined for the to be tested DRAM devices. The Automatic Classification Shipping (ACS) data base is updated with test related data, the testing is performed whereby DRAM devices are assigned categories from with DRAM classes are derived. These identified classes are used to sort the tested DRAM devices in accordance with their tested functional performance characteristics.
    Type: Grant
    Filed: November 2, 2002
    Date of Patent: July 18, 2006
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Yu-Chih Chen, Remaerd Hsieh
  • Publication number: 20040088074
    Abstract: A new method and system of testing and classifying semiconductor devices is provided. User requirements are collected for this purpose, test specifications and test functions are defined for the to be tested DRAM devices. The Automatic Classification Shipping (ACS) data base is updated with test related data, the testing is performed whereby DRAM devices are assigned categories from with DRAM classes are derived. These identified classes are used to sort the tested DRAM devices in accordance with their tested functional performance characteristics.
    Type: Application
    Filed: November 2, 2002
    Publication date: May 6, 2004
    Applicant: Taiwan Semiconductor Manufacturing Company
    Inventors: Yu-Chih Chen, Remaerd Hsieh